Proceedings Paper
The origin of interferometric effect in scattering near-field scanning optical microscopy (presentation video)| Format | Member Price | Non-Member Price |
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Paper Abstract
In this work, we investigate the formation of interference patterns appearing in s-NSOM results. A single nanoslit is used to demonstrate the mechanism of formation of these interference patterns experimentaly: the interaction between the in-plane component of the incident light and SPP launched by the nanoslit. This is in contrast to some other explanations that the SPP is launched from the NSOM probe. We also use an analytical model and numerical simulations to compute the formation of interference patters. This study will help to understand s-NSOM results from plasmonic nanostructures.
Paper Details
Date Published: 19 November 2014
PDF: 1 pages
Proc. SPIE 9169, Nanoimaging and Nanospectroscopy II, 91690I (19 November 2014); doi: 10.1117/12.2062810
Published in SPIE Proceedings Vol. 9169:
Nanoimaging and Nanospectroscopy II
Prabhat Verma; Alexander Egner, Editor(s)
PDF: 1 pages
Proc. SPIE 9169, Nanoimaging and Nanospectroscopy II, 91690I (19 November 2014); doi: 10.1117/12.2062810
Show Author Affiliations
Yan Li, Purdue Univ. (United States)
Nan Zhou, Purdue Univ. (United States)
Edward C. Kinzel, Missouri Univ. of Science and Technology (United States)
Nan Zhou, Purdue Univ. (United States)
Edward C. Kinzel, Missouri Univ. of Science and Technology (United States)
Xifeng Ren, Univ. of Science and Technology of China (China)
Xianfan Xu, Purdue Univ. (United States)
Xianfan Xu, Purdue Univ. (United States)
Published in SPIE Proceedings Vol. 9169:
Nanoimaging and Nanospectroscopy II
Prabhat Verma; Alexander Egner, Editor(s)
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