Share Email Print

Proceedings Paper

Flux monitoring by x-ray diffracting crystals under ambient air conditions
Author(s): Stanislav Stoupin; Sergey V. Baryshev; Sergey P. Antipov
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

An electrical response of a diffracting diamond (111) crystal was studied in a single electrode configuration where the electrode was deposited on a small portion of the crystal entrance surface. The experiment was performed in ambient air using an x-ray beam after a Si (111) double-crystal monochromator with the diamond crystal set in the Bragg diffraction condition. It was found that the electric current as a function of the Bragg angle exhibits behavior characteristic of secondary yield curves (e.g.,1). It is proposed to utilize this effect to monitor the intensity of the Bragg reflected x-ray beam. Such non-invasive monitoring does not rely on the use of stand-alone radiation monitors (e.g., ionization chambers) and is expected to facilitate x-ray optics alignment procedures. As an attempt to improve signal-to-noise ratio by containing the electric field in the optical element an electric response of a high-resistivity silicon crystal was studied in a two-electrode configuration. Preliminary results are reported.

Paper Details

Date Published: 5 September 2014
PDF: 5 pages
Proc. SPIE 9207, Advances in X-Ray/EUV Optics and Components IX, 92070B (5 September 2014); doi: 10.1117/12.2062495
Show Author Affiliations
Stanislav Stoupin, Argonne National Lab. (United States)
Sergey V. Baryshev, Euclid TechLabs. (United States)
Sergey P. Antipov, Euclid TechLabs. (United States)

Published in SPIE Proceedings Vol. 9207:
Advances in X-Ray/EUV Optics and Components IX
Christian Morawe; Ali M. Khounsary; Shunji Goto, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?