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Proceedings Paper

Device to analyze leakage current pathways in photovoltaic modules in real-time
Author(s): Neelkanth Dhere; Narendra Shiradkar; Eric Schneller
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Paper Abstract

Series connection of PV modules results in buildup of high voltage between the frame and cell circuit which leads to leakage current flow through the module packaging materials. Long term application of high voltage bias results in PV module degradation by Potential Induced Degradation (PID). A novel device called custom laminate is developed at Florida Solar Energy Center that can identify dominant leakage current paths in PV module packaging materials. In this paper, insulation resistance tests are carried out on a commercial 60-cell c-Si module and the nature of leakage current as a function of aluminum foil configuration, applied voltage and duration is studied. The insights gained from the analysis of leakage currents under various circumstances are used to obtain more accurate and reliable measurements from the custom laminate.

Paper Details

Date Published: 8 October 2014
PDF: 6 pages
Proc. SPIE 9179, Reliability of Photovoltaic Cells, Modules, Components, and Systems VII, 91790Q (8 October 2014); doi: 10.1117/12.2062459
Show Author Affiliations
Neelkanth Dhere, Univ. of Central Florida (United States)
Narendra Shiradkar, Univ. of Central Florida (United States)
Eric Schneller, Univ. of Central Florida (United States)

Published in SPIE Proceedings Vol. 9179:
Reliability of Photovoltaic Cells, Modules, Components, and Systems VII
Neelkanth G. Dhere, Editor(s)

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