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Proceedings Paper

Iterative reconstruction optimisations for high angle cone-beam micro-CT
Author(s): B. Recur; M. Fauconneau; A. Kingston; G. Myers; A. Sheppard
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Paper Abstract

We address several acquisition questions that have arisen for the high cone-angle helical-scanning micro-CT facility developed at the Australian National University. These challenges are generally known in medical and industrial cone-beam scanners but can be neglected in these systems. For our large datasets, with more than 20483 voxels, minimising the number of operations (or iterations) is crucial. Large cone-angles enable high signal-to-noise ratio imaging and a large helical pitch to be used. This introduces two challenges: (i) non-uniform resolution throughout the reconstruction, (ii) over-scan beyond the region-of-interest significantly increases re- quired reconstructed volume size. Challenge (i) can be addressed by using a double-helix or lower pitch helix but both solutions slow down iterations. Challenge (ii) can also be improved by using a lower pitch helix but results in more projections slowing down iterations. This may be overcome using less projections per revolution but leads to more iterations required. Here we assume a given total time for acquisition and a given reconstruction technique (SART) and seek to identify the optimal trajectory and number of projections per revolution in order to produce the best tomogram, minimise reconstruction time required, and minimise memory requirements.

Paper Details

Date Published: 11 September 2014
PDF: 12 pages
Proc. SPIE 9212, Developments in X-Ray Tomography IX, 921214 (11 September 2014); doi: 10.1117/12.2062450
Show Author Affiliations
B. Recur, The Australian National Univ. (Australia)
M. Fauconneau, The Australian National Univ. (Australia)
A. Kingston, The Australian National Univ. (Australia)
G. Myers, The Australian National Univ. (Australia)
A. Sheppard, The Australian National Univ. (Australia)

Published in SPIE Proceedings Vol. 9212:
Developments in X-Ray Tomography IX
Stuart R. Stock, Editor(s)

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