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Proceedings Paper

Research, test, and development activities performed by junction box bypass diode task force # 4
Author(s): Vivek Gade; Narendra Shiradkar; Paul Robusto; Kent Whitfield; John Wohlgemuth; Yasunori Uchida; Neelkanth G. Dhere
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Paper Abstract

The paper provides latest update on the activities performed by the group #4-diodes, shading and reverse bias of the PV Module Quality Assurance Task Force (PVQAT) in the areas such as electrostatic discharge testing and standards, thermal runaway testing, diode junction temperature measurement techniques, thermal endurance tests and analysis of field failures. Philosophy, motivation and future direction for the group #4 is also discussed.

Paper Details

Date Published: 8 October 2014
PDF: 7 pages
Proc. SPIE 9179, Reliability of Photovoltaic Cells, Modules, Components, and Systems VII, 91790H (8 October 2014); doi: 10.1117/12.2062195
Show Author Affiliations
Vivek Gade, Jabil Circuit, Inc. (United States)
Narendra Shiradkar, Univ. of Central Florida (United States)
Paul Robusto, Miasole Inc. (United States)
Kent Whitfield, SunEdison Inc. (United States)
John Wohlgemuth, National Renewable Energy Lab. (United States)
Yasunori Uchida, Japan Electrical & Environment Technology Labs. (Japan)
Neelkanth G. Dhere, Univ. of Central Florida (United States)

Published in SPIE Proceedings Vol. 9179:
Reliability of Photovoltaic Cells, Modules, Components, and Systems VII
Neelkanth G. Dhere, Editor(s)

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