
Proceedings Paper
Wavefront propagation simulations for a UV/soft x-ray beamline: Electron Spectro-Microscopy beamline at NSLS-IIFormat | Member Price | Non-Member Price |
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Paper Abstract
A “source-to-sample” wavefront propagation analysis of the Electron Spectro-Microscopy (ESM) UV / soft X-ray
beamline, which is under construction at the National Synchrotron Light Source II (NSLS-II) in the Brookhaven
National Laboratory, has been conducted. All elements of the beamline - insertion device, mirrors, variable-line-spacing
gratings and slits - are included in the simulations. Radiation intensity distributions at the sample position are displayed
for representative photon energies in the UV range (20 - 100 eV) where diffraction effects are strong. The finite
acceptance of the refocusing mirrors is the dominating factor limiting the spatial resolution at the sample (by ~3 μm at
20 eV). Absolute estimates of the radiation flux and energy resolution at the sample are also obtained from the
electromagnetic calculations. The analysis of the propagated UV range undulator radiation at different deflection
parameter values demonstrates that within the beamline angular acceptance a slightly “red-shifted” radiation provides
higher flux at the sample and better energy resolution compared to the on-axis resonant radiation of the fundamental
harmonic.
Paper Details
Date Published: 5 September 2014
PDF: 9 pages
Proc. SPIE 9209, Advances in Computational Methods for X-Ray Optics III, 92090I (5 September 2014); doi: 10.1117/12.2061979
Published in SPIE Proceedings Vol. 9209:
Advances in Computational Methods for X-Ray Optics III
Manuel Sanchez del Rio; Oleg Chubar, Editor(s)
PDF: 9 pages
Proc. SPIE 9209, Advances in Computational Methods for X-Ray Optics III, 92090I (5 September 2014); doi: 10.1117/12.2061979
Show Author Affiliations
N. Canestrari, Brookhaven National Lab. (United States)
V. Bisogni, Brookhaven National Lab. (United States)
A. Walter, Brookhaven National Lab. (United States)
Y. Zhu, Brookhaven National Lab. (United States)
V. Bisogni, Brookhaven National Lab. (United States)
A. Walter, Brookhaven National Lab. (United States)
Y. Zhu, Brookhaven National Lab. (United States)
J. Dvorak, Brookhaven National Lab. (United States)
E. Vescovo, Brookhaven National Lab. (United States)
O. Chubar, Brookhaven National Lab. (United States)
E. Vescovo, Brookhaven National Lab. (United States)
O. Chubar, Brookhaven National Lab. (United States)
Published in SPIE Proceedings Vol. 9209:
Advances in Computational Methods for X-Ray Optics III
Manuel Sanchez del Rio; Oleg Chubar, Editor(s)
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