
Proceedings Paper
The developmental long trace profiler (DLTP) optimized for metrology of side-facing optics at the ALSFormat | Member Price | Non-Member Price |
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$17.00 | $21.00 |
Paper Abstract
The autocollimator and moveable pentaprism based DLTP [NIM A 616 (2010) 212-223], a low-budget, NOM-like
profiler at the Advanced Light Source (ALS), has been upgraded to provide fast, highly accurate surface slope metrology
for long, side-facing, x-ray optics. This instrument arrangement decreases sensitivity to environmental conditions and
removes the gravity effect on mirror shape. We provide design details of an affordable base tool, including clean-room
environmental arrangements in the new ALS X-ray Optics Laboratory with advanced temperature stabilization and
turbulence reduction, that yield measurements in under 8 hours with accuracy better than 30 nanoradians (rms) for super
polished,190 mm flat optics, limited mainly by residual temporal instability of the experimental set-up. The upgraded
DLTP has been calibrated for highly curved x-ray optics, allowing same day measurements of a 15 m ROC sphere with
accuracy of better than 100 nanoradians (rms). The developed calibration procedure is discussed in detail. We propose
this specific 15 m ROC sphere for use as a round-robin calibration test optic.
Paper Details
Date Published: 17 September 2014
PDF: 11 pages
Proc. SPIE 9206, Advances in Metrology for X-Ray and EUV Optics V, 920603 (17 September 2014); doi: 10.1117/12.2061969
Published in SPIE Proceedings Vol. 9206:
Advances in Metrology for X-Ray and EUV Optics V
Lahsen Assoufid; Haruhiko Ohashi; Anand Krishna Asundi, Editor(s)
PDF: 11 pages
Proc. SPIE 9206, Advances in Metrology for X-Ray and EUV Optics V, 920603 (17 September 2014); doi: 10.1117/12.2061969
Show Author Affiliations
Ian Lacey, Lawrence Berkeley National Lab. (United States)
Nikolay A. Artemiev, Lawrence Berkeley National Lab. (United States)
Edward E. Domning, Lawrence Berkeley National Lab. (United States)
Wayne R. McKinney, Lawrence Berkeley National Lab. (United States)
Nikolay A. Artemiev, Lawrence Berkeley National Lab. (United States)
Edward E. Domning, Lawrence Berkeley National Lab. (United States)
Wayne R. McKinney, Lawrence Berkeley National Lab. (United States)
Gregory Y. Morrison, Lawrence Berkeley National Lab. (United States)
Simon A. Morton, Lawrence Berkeley National Lab. (United States)
Brian V. Smith, Lawrence Berkeley National Lab. (United States)
Valeriy V. Yashchuk, Lawrence Berkeley National Lab. (United States)
Simon A. Morton, Lawrence Berkeley National Lab. (United States)
Brian V. Smith, Lawrence Berkeley National Lab. (United States)
Valeriy V. Yashchuk, Lawrence Berkeley National Lab. (United States)
Published in SPIE Proceedings Vol. 9206:
Advances in Metrology for X-Ray and EUV Optics V
Lahsen Assoufid; Haruhiko Ohashi; Anand Krishna Asundi, Editor(s)
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