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Proceedings Paper

Dynamic shape measurements of rough surface with a two wavelength method
Author(s): N. Andrés; L. A. Arévalo-Díaz; J. A. Lorda; V. Palero; J. Lobera; M. P. Arroyo
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Paper Abstract

Digital Speckle Pattern Interferometry (DSPI) has been applied to measure shape of solid rough objects. A two wavelength setup with one single recording has been applied. Spatial Phase Shifting techniques, with different carrier fringes for each wavelength, have been used in order to produce a spatial multiplex. Selecting each aperture image in the Fourier plane, the amplitude and the phase of the object beam is obtained for each wavelength. The subtraction of those waves produces a wrapped phase map that can be considered a contour line map for a synthetic wavelength. The technique has been applied in different material and the visibility of the fringes is observed. The possibilities and limits of the technique have been analyzed.

Paper Details

Date Published: 18 August 2014
PDF: 7 pages
Proc. SPIE 9204, Interferometry XVII: Advanced Applications, 92040B (18 August 2014); doi: 10.1117/12.2061889
Show Author Affiliations
N. Andrés, Univ. de Zaragoza (Spain)
L. A. Arévalo-Díaz, Univ. de Zaragoza (Spain)
J. A. Lorda, Univ. de Zaragoza (Spain)
V. Palero, Univ. de Zaragoza (Spain)
J. Lobera, Ctr. Univ. de la Defensa de Zaragoza (Spain)
M. P. Arroyo, Univ. de Zaragoza (Spain)

Published in SPIE Proceedings Vol. 9204:
Interferometry XVII: Advanced Applications
Cosme Furlong; Christophe Gorecki; Peter J. de Groot; Erik L. Novak, Editor(s)

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