
Proceedings Paper
Microfocusing beamline for XUV-XUV pump-probe experiments using HH generationFormat | Member Price | Non-Member Price |
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Paper Abstract
The possibility to obtain micrometric focal spot in the extreme-ultraviolet (XUV) region opens the way to XUV-XUV
experiments in high-order harmonics beamlines. A beamline designed for this purpose is here presented. The peculiarity
of the optical design relies on the use of only toroidal mirrors in place of the more expensive Cartesian optics. The coma
aberration, usually dominating the quality of the focal spot when toroidal mirrors are used with high levels of demagnification,
is compensated using mirrors in a subtractive (Z-shape) configuration. In addition, the compensating
output mirror decouples the length of the exit arm from the de-magnification factor, in this way the length of the exit arm
can be increased to install even a large experimental chamber. Three mirrors with optical power are required, in order to
assure an optimal focalization. In order to guarantee a day-to-day reproducible working condition, the mirrors are
mounted on remotely adjustable optical stages, that are controlled via a genetic algorithm with the feedback on the
quality of the focal spot. This solution helps the users to reach the best focalization conditions in a reliable way. The
results obtained during the beamline commissioning phase are presented. Emphasis is placed in the characterization of
the spot size and in the performances of the genetic algorithm.
Paper Details
Date Published: 5 September 2014
PDF: 9 pages
Proc. SPIE 9208, Adaptive X-Ray Optics III, 92080J (5 September 2014); doi: 10.1117/12.2061867
Published in SPIE Proceedings Vol. 9208:
Adaptive X-Ray Optics III
Stephen L. O'Dell; Ali M. Khounsary, Editor(s)
PDF: 9 pages
Proc. SPIE 9208, Adaptive X-Ray Optics III, 92080J (5 September 2014); doi: 10.1117/12.2061867
Show Author Affiliations
Fabio Frassetto, IFN-CNR Padova (Italy)
Sunilkumar Anumula, Politecnico di Milano (Italy)
Francesca Calegari, IFN-CNR Milano (Italy)
Sunilkumar Anumula, Politecnico di Milano (Italy)
Francesca Calegari, IFN-CNR Milano (Italy)
Andrea Trabattoni, Politecnico di Milano (Italy)
Mauro Nisoli, Politecnico di Milano (Italy)
IFN-CNR Milano (Italy)
Luca Poletto, IFN-CNR Padova (Italy)
Mauro Nisoli, Politecnico di Milano (Italy)
IFN-CNR Milano (Italy)
Luca Poletto, IFN-CNR Padova (Italy)
Published in SPIE Proceedings Vol. 9208:
Adaptive X-Ray Optics III
Stephen L. O'Dell; Ali M. Khounsary, Editor(s)
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