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Proceedings Paper

Dynamic temperature field measurements using a polarization phase shifting technique
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Paper Abstract

An optical system capable of simultaneously grabbing three phase-shifted interferometric images was developed for dynamic temperature field measurements outside of a thin flame. The polarization phase shifting technique and a Michelson interferometer that is coupled to a 4-f system with a Ronchi grating placed at the frequency plane are used. This configuration permits the phase-shifted interferograms to be grabbed simultaneously by one CCD. The temperature field measurement is based on measuring the refraction index difference by solving the inverse Abel transform, which requires information obtained by the fringe order localization. Experimental results of a dynamic event are presented varying in time.

Paper Details

Date Published: 18 August 2014
PDF: 5 pages
Proc. SPIE 9204, Interferometry XVII: Advanced Applications, 92040E (18 August 2014); doi: 10.1117/12.2061840
Show Author Affiliations
David Ignacio Serrano-García, Utsunomiya Univ. (Japan)
Amalia Martínez-García, Ctr. de Investigaciones en Óptica, A.C. (Mexico)
Noel-Ivan Toto-Arellano, Univ. Tecnológica de Tulancingo (Mexico)
Yukitoshi Otani, Utsunomiya Univ. (Japan)

Published in SPIE Proceedings Vol. 9204:
Interferometry XVII: Advanced Applications
Cosme Furlong; Christophe Gorecki; Peter J. de Groot; Erik L. Novak, Editor(s)

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