
Proceedings Paper
Bilayer structures optimization as antireflective coating for silicon solar cellsFormat | Member Price | Non-Member Price |
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Paper Abstract
The optimization of a silicon solar cell involves also the design of a proper antireflective coating (AR). We have considered different bilayer structures. The use of bilayers is oriented to have an antireflective effect on a broader range of wavelengths compared to single film AR. The materials considered include silicon oxide, magnesium fluoride, silicon nitride and titanium oxide. The thickness of each film in each structure has been optimized by theoretical calculations in order to minimize the weighted reflectivity, Rw. This is calculated taking into account the optical reflectivity, the internal quantum efficiency of the silicon solar cell and the solar flux on all the range of wavelengths of interest. Some of these optimized structures have been realized by e-beam vapor deposition as first tests. The improved optical performance of the samples have been verified at the UV-vis-NIR spectrophotometer.
Paper Details
Date Published: 7 October 2014
PDF: 8 pages
Proc. SPIE 9177, Thin Films for Solar and Energy Technology VI, 91770R (7 October 2014); doi: 10.1117/12.2061800
Published in SPIE Proceedings Vol. 9177:
Thin Films for Solar and Energy Technology VI
Louay A. Eldada; Michael J. Heben, Editor(s)
PDF: 8 pages
Proc. SPIE 9177, Thin Films for Solar and Energy Technology VI, 91770R (7 October 2014); doi: 10.1117/12.2061800
Show Author Affiliations
S. Zuccon, Institute for Photonics and Nanotechnologies, CNR (Italy)
P. Zuppella, Institute for Photonics and Nanotechnologies, CNR (Italy)
P. Zuppella, Institute for Photonics and Nanotechnologies, CNR (Italy)
A. J. Corso, Institute for Photonics and Nanotechnologies, CNR (Italy)
M. G. Pelizzo, Institute for Photonics and Nanotechnologies, CNR (Italy)
M. G. Pelizzo, Institute for Photonics and Nanotechnologies, CNR (Italy)
Published in SPIE Proceedings Vol. 9177:
Thin Films for Solar and Energy Technology VI
Louay A. Eldada; Michael J. Heben, Editor(s)
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