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Proceedings Paper

Estimation and measurement of space variant features of imaging systems and analysis of their influence on accuracy in astronomical imaging
Author(s): Elena Anisimova; Jan Bednář; Martin Blažek; Petr Janout; Karel Fliegel; Petr Páta; Stanislav Vítek; Jan Švihlík
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Paper Abstract

Additional monitoring equipment is commonly used in astronomical imaging. This electro-optical system usually complements the main telescope during acquisition of astronomical phenomena or supports its operation e.g. evaluating the weather conditions. Typically it is a wide-field imaging system, which consists of a digital camera equipped with fish-eye lens. The wide-field imaging system cannot be considered as a space-invariant because of space-variant nature of its input lens. In our previous research efforts we have focused on measurement and analysis of images obtained from the subsidiary all-sky monitor WILLIAM (WIde-field aLL-sky Images Analyzing Monitoring system). Space-variant part of this imaging system consists of input lens with 180 fi angle of view in horizontal and 154 fi in vertical direction. For a precise astronomical measurement over the entire field of view, it is very important to know how the optical aberrations affect characteristics of the imaging system, especially its PSF (Point Spread Function). Two methods were used for characterization of the space-variant PSF, i.e. measurement in the optical laboratory and estimation using acquired images and Zernike polynomials. Analysis of results obtained using these two methods is presented in the paper. Accuracy of astronomical measurements is also discussed while considering the space-variant PSF of the system.

Paper Details

Date Published: 23 September 2014
PDF: 13 pages
Proc. SPIE 9217, Applications of Digital Image Processing XXXVII, 92171E (23 September 2014); doi: 10.1117/12.2061736
Show Author Affiliations
Elena Anisimova, Czech Technical Univ. in Prague (Czech Republic)
Jan Bednář, Czech Technical Univ. in Prague (Czech Republic)
Martin Blažek, Czech Technical Univ. in Prague (Czech Republic)
Petr Janout, Czech Technical Univ. in Prague (Czech Republic)
Karel Fliegel, Czech Technical Univ. in Prague (Czech Republic)
Petr Páta, Czech Technical Univ. in Prague (Czech Republic)
Stanislav Vítek, Czech Technical Univ. in Prague (Czech Republic)
Jan Švihlík, Institute of Chemical Technology (Czech Republic)

Published in SPIE Proceedings Vol. 9217:
Applications of Digital Image Processing XXXVII
Andrew G. Tescher, Editor(s)

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