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Proceedings Paper

X-ray multilens interferometer based on Si refractive lenses
Author(s): A. Snigirev; I. Snigireva; M. Lyubomirskiy; V. Kohn; V. Yunkin; S. Kuznetsov
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Paper Abstract

We report a multilens X-ray interferometer consisting of six parallel arrays of planar compound refractive lenses. The main concept of new interferometer is based on the same principle such a bilens interferometer. The interference fringe pattern produced by the multilens interferometer was described by Talbot imaging formalism. A theoretical analysis of the interference pattern formation was carried out and corresponding computer simulations were performed. The proposed multilens interferometer was experimentally tested at ID06 ESRF beamline in the X-ray energy range from 10 to 30 keV. Experimentally recorded fractional Talbot images are in a good agreement with computer calculations.

Paper Details

Date Published: 5 September 2014
PDF: 12 pages
Proc. SPIE 9207, Advances in X-Ray/EUV Optics and Components IX, 920703 (5 September 2014); doi: 10.1117/12.2061616
Show Author Affiliations
A. Snigirev, ESRF - The European Synchrotron (France)
I. Snigireva, ESRF - The European Synchrotron (France)
M. Lyubomirskiy, ESRF - The European Synchrotron (France)
V. Kohn, Russian Research Ctr. Kurchatov Institute (Russian Federation)
V. Yunkin, Institute of Microelectronics Technology and High Purity Materials (Russian Federation)
S. Kuznetsov, Institute of Microelectronics Technology and High Purity Materials (Russian Federation)

Published in SPIE Proceedings Vol. 9207:
Advances in X-Ray/EUV Optics and Components IX
Christian Morawe; Ali M. Khounsary; Shunji Goto, Editor(s)

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