
Proceedings Paper
Optical waveguide modeling of conducting metal oxide enabled evanescent wave absorption spectroscopy sensorsFormat | Member Price | Non-Member Price |
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Paper Abstract
Recent work has demonstrated significant promise for high temperature optical gas sensing based upon optical property
responses in a class of high electronic conductivity metal oxides. In this work, we theoretically simulate the response of
aluminum-doped zinc-oxide (an exemplary conducting metal oxide) in optical fiber evanescent wave absorption
spectroscopy sensor devices through the application of a general model of the optical constants for this class of materials
in conjunction with prior published material-specific constants for the systems under investigation. Theoretical
simulations are compared with recently published experimental results for Al-doped ZnO thin films and the various
factors responsible for optimizing sensing responses in this class of materials will be discussed.
Paper Details
Date Published: 5 September 2014
PDF: 9 pages
Proc. SPIE 9202, Photonics Applications for Aviation, Aerospace, Commercial, and Harsh Environments V, 92021I (5 September 2014); doi: 10.1117/12.2061362
Published in SPIE Proceedings Vol. 9202:
Photonics Applications for Aviation, Aerospace, Commercial, and Harsh Environments V
Alex A. Kazemi; Bernard C. Kress; Edgar A. Mendoza, Editor(s)
PDF: 9 pages
Proc. SPIE 9202, Photonics Applications for Aviation, Aerospace, Commercial, and Harsh Environments V, 92021I (5 September 2014); doi: 10.1117/12.2061362
Show Author Affiliations
M. Buric, National Energy Technology Lab. (United States)
P. R. Ohodnicki Jr., National Energy Technology Lab. (United States)
Carnegie Mellon Univ. (United States)
P. R. Ohodnicki Jr., National Energy Technology Lab. (United States)
Carnegie Mellon Univ. (United States)
B. Chorpening, National Energy Technology Lab. (United States)
Published in SPIE Proceedings Vol. 9202:
Photonics Applications for Aviation, Aerospace, Commercial, and Harsh Environments V
Alex A. Kazemi; Bernard C. Kress; Edgar A. Mendoza, Editor(s)
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