Share Email Print

Proceedings Paper

Dual-wavelength diffraction phase microscopy for real-time dispersion measurement
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We present a dual-wavelength diffraction phase microscopy (DW-DPM) that obtains the wavelength-differentiated dual phase images in a single shot of interference fringe acquisition. For this, the diffraction phase microscopy (DPM) system was constructed with a transmission grating and a spatial filter that form a common-path interferometer. With a light source of two spectral components, a different diffraction order of the grating was utilized for each. This resulted in a combined but distinguishable interference pattern to be acquired by a single image sensor. In this research, our dualwavelength phase imaging scheme was applied to simultaneously measure dispersion of a sample. Stable and reliable measurements could be performed in a single shot due to the robust structure of our DW-DPM system.

Paper Details

Date Published: 18 August 2014
PDF: 4 pages
Proc. SPIE 9203, Interferometry XVII: Techniques and Analysis, 92030T (18 August 2014); doi: 10.1117/12.2061225
Show Author Affiliations
Mohammad Reza Jafarfard, Yonsei Univ. (Korea, Republic of)
Behnam Tayebi, Yonsei Univ. (Korea, Republic of)
Dug Young Kim, Yonsei Univ. (Korea, Republic of)

Published in SPIE Proceedings Vol. 9203:
Interferometry XVII: Techniques and Analysis
Katherine Creath; Jan Burke; Joanna Schmit, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?