
Proceedings Paper
An error function minimization approach for the inverse problem of adaptive mirrors tuningFormat | Member Price | Non-Member Price |
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Paper Abstract
Adaptive x-ray optics are more and more used in synchrotron beamlines, and it is probable that they will be considered
for the future high-power free-electron laser sources, as the European XFEL now under construction in Hamburg, or
similar projects now in discussion. These facilities will deliver a high power x-ray beam, with an expected high heat load
delivered on the optics. For this reason, bendable mirrors are required to actively compensate the resulting wavefront
distortion. On top of that, the mirror could have also intrinsic surface defects, as polishing errors or mounting stresses. In
order to be able to correct the mirror surface with a high precision to maintain its challenging requirements, the mirror
surface is usually characterized with a high accuracy metrology to calculate the actuators pulse functions and to assess its
initial shape. After that, singular value decomposition (SVD) is used to find the signals to be applied into the actuators,
to reach the desired surface deformation or correction. But in some cases this approach could be not robust enough for
the needed performance. We present here a comparison between the classical SVD method and an error function
minimization based on root-mean-square calculation. Some examples are provided, using a simulation of the European
XFEL mirrors design as a case of study, and performances of the algorithms are evaluated in order to reach the ultimate
quality in different scenarios. The approach could be easily generalized to other situations as well.
Paper Details
Date Published: 5 September 2014
PDF: 7 pages
Proc. SPIE 9208, Adaptive X-Ray Optics III, 92080I (5 September 2014); doi: 10.1117/12.2061177
Published in SPIE Proceedings Vol. 9208:
Adaptive X-Ray Optics III
Stephen L. O'Dell; Ali M. Khounsary, Editor(s)
PDF: 7 pages
Proc. SPIE 9208, Adaptive X-Ray Optics III, 92080I (5 September 2014); doi: 10.1117/12.2061177
Show Author Affiliations
Frank Siewert, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (Germany)
Harald Sinn, European XFEL GmbH (Germany)
Harald Sinn, European XFEL GmbH (Germany)
Published in SPIE Proceedings Vol. 9208:
Adaptive X-Ray Optics III
Stephen L. O'Dell; Ali M. Khounsary, Editor(s)
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