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Proceedings Paper

Analysis of particulates on tape lift samples
Author(s): Robert M. Moision; John A. Chaney; Chris J. Panetta; De-Ling Liu
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Paper Abstract

Particle counts on tape lift samples taken from a hardware surface exceeded threshold requirements in six successive tests despite repeated cleaning of the surface. Subsequent analysis of the particle size distributions of the failed tests revealed that the handling and processing of the tape lift samples may have played a role in the test failures. In order to explore plausible causes for the observed size distribution anomalies, scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDX), and time-of-flight secondary ion mass spectrometry (ToF-SIMS) were employed to perform chemical analysis on collected particulates. SEM/EDX identified Na and S containing particles on the hardware samples in a size range identified as being responsible for the test failures. ToF-SIMS was employed to further examine the Na and S containing particulates and identified the molecular signature of sodium alkylbenzene sulfonates, a common surfactant used in industrial detergent. The root cause investigation suggests that the tape lift test failures originated from detergent residue left behind on the glass slides used to mount and transport the tape following sampling and not from the hardware surface.

Paper Details

Date Published: 18 September 2014
PDF: 7 pages
Proc. SPIE 9196, Systems Contamination: Prediction, Measurement, and Control 2014, 919604 (18 September 2014); doi: 10.1117/12.2061154
Show Author Affiliations
Robert M. Moision, The Aerospace Corp. (United States)
John A. Chaney, The Aerospace Corp. (United States)
Chris J. Panetta, The Aerospace Corp. (United States)
De-Ling Liu, The Aerospace Corp. (United States)

Published in SPIE Proceedings Vol. 9196:
Systems Contamination: Prediction, Measurement, and Control 2014
Nancy Carosso; Joanne Egges, Editor(s)

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