
Proceedings Paper
Conical diffraction as a versatile building block to implement new imaging modalities for superresolution in fluorescence microscopyFormat | Member Price | Non-Member Price |
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Paper Abstract
We present a new technology for super-resolution fluorescence imaging, based on conical diffraction. Conical
diffraction is a linear, singular phenomenon taking place when a polarized beam is diffracted through a biaxial
crystal. The illumination patterns generated by conical diffraction are more compact than the classical Gaussian
beam; we use them to generate a super-resolution imaging modality. Conical Diffraction Microscopy (CODIM)
resolution enhancement can be achieved with any type of objective on any kind of sample preparation and standard
fluorophores. Conical diffraction can be used in multiple fashion to create new and disruptive technologies
for super-resolution microscopy. This paper will focus on the first one that has been implemented and give a
glimpse at what the future of microscopy using conical diffraction could be.
Paper Details
Date Published: 28 August 2014
PDF: 6 pages
Proc. SPIE 9169, Nanoimaging and Nanospectroscopy II, 916905 (28 August 2014); doi: 10.1117/12.2061059
Published in SPIE Proceedings Vol. 9169:
Nanoimaging and Nanospectroscopy II
Prabhat Verma; Alexander Egner, Editor(s)
PDF: 6 pages
Proc. SPIE 9169, Nanoimaging and Nanospectroscopy II, 916905 (28 August 2014); doi: 10.1117/12.2061059
Show Author Affiliations
Clément Fallet, Bioaxial (France)
Julien Caron, Bioaxial (France)
Stephane Oddos, Bioaxial (France)
Jean-Yves Tinevez, Institut Pasteur (France)
Julien Caron, Bioaxial (France)
Stephane Oddos, Bioaxial (France)
Jean-Yves Tinevez, Institut Pasteur (France)
Lionel Moisan, Univ. Paris Descartes, Lab. MAP5 (France)
Gabriel Y. Sirat, Bioaxial (France)
Philippe O. Braitbart, Bioaxial (France)
Spencer L. Shorte, Institut Pasteur (France)
Gabriel Y. Sirat, Bioaxial (France)
Philippe O. Braitbart, Bioaxial (France)
Spencer L. Shorte, Institut Pasteur (France)
Published in SPIE Proceedings Vol. 9169:
Nanoimaging and Nanospectroscopy II
Prabhat Verma; Alexander Egner, Editor(s)
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