
Proceedings Paper
Phase characterization of attosecond multilayer mirrors: from EUV to soft x-raysFormat | Member Price | Non-Member Price |
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Paper Abstract
Phase controlled multilayer mirrors provide an efficient solution to transport, focus and/or compress attosecond pulses in
the extreme ultraviolet (EUV) domain (30 – 100 eV). In this spectral range, one can access the spectral phase of the
multilayer stack by measuring the photocurrent generated at the mirror surface as a function of the incoming photon
energy. It has been already demonstrated that one can extract the spectral phase from such measurements under specific
hypotheses. In this paper, we present the experimental protocol for such measurements and discuss the validity of this
technique in the EUV and in the soft x-ray domains. In the EUV spectral range, our experimental results are in good
agreement with simulations. However, the previous hypotheses are no longer valid at shorter wavelengths, in the soft xrays
domain. This is mainly due to the fact that the electron mean free path becomes comparable to the individual layer
thickness in the multilayer mirror. Here we propose a new method that enables one to extend the validity of phase
characterization using photocurrent measurements in the soft x-ray domain (100 – 1000 eV). We present the first
experimental results concerning the phase characterization of Cr/Sc multilayer mirrors in the water window and compare
these results with simulation.
Paper Details
Date Published: 5 September 2014
PDF: 7 pages
Proc. SPIE 9207, Advances in X-Ray/EUV Optics and Components IX, 92070K (5 September 2014); doi: 10.1117/12.2061022
Published in SPIE Proceedings Vol. 9207:
Advances in X-Ray/EUV Optics and Components IX
Christian Morawe; Ali M. Khounsary; Shunji Goto, Editor(s)
PDF: 7 pages
Proc. SPIE 9207, Advances in X-Ray/EUV Optics and Components IX, 92070K (5 September 2014); doi: 10.1117/12.2061022
Show Author Affiliations
Franck Delmotte, Lab. Charles Fabry, CNRS, Institut d'Optique, Univ. Paris Sud (France)
Charles Bourassin-Bouchet, Lab. Charles Fabry, CNRS, Institut d'Optique, Univ. Paris Sud (France)
Sébastien de Rossi, Lab. Charles Fabry, CNRS, Institut d'Optique, Univ. Paris Sud (France)
Charles Bourassin-Bouchet, Lab. Charles Fabry, CNRS, Institut d'Optique, Univ. Paris Sud (France)
Sébastien de Rossi, Lab. Charles Fabry, CNRS, Institut d'Optique, Univ. Paris Sud (France)
Evgueni Meltchakov, Lab. Charles Fabry, CNRS, Institut d'Optique, Univ. Paris Sud (France)
Angelo Giglia, Lab. Nazionale TASC, CNR, INFM (Italy)
Stefano Nannarone, Consiglio Nazionale delle Ricerche (Italy)
Angelo Giglia, Lab. Nazionale TASC, CNR, INFM (Italy)
Stefano Nannarone, Consiglio Nazionale delle Ricerche (Italy)
Published in SPIE Proceedings Vol. 9207:
Advances in X-Ray/EUV Optics and Components IX
Christian Morawe; Ali M. Khounsary; Shunji Goto, Editor(s)
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