
Proceedings Paper
Integrated control system environment for high-throughput tomographyFormat | Member Price | Non-Member Price |
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Paper Abstract
A new control system for high-throughput experiments (X-Ray, Neutrons) is introduced in this article. The system
consists of several software components which are required to make optimized use of the beamtime and to fulfill the
demand to implement the new standardized data format established within the Helmholtz Association in Germany. The
main components are: PreExperiment Data Collector; Status server; Data Format Server. Especially for tomography a
concept for an online reconstruction based on GPU computing is presented. One of the main goals of the system is to
collect data that extends standard experimental data, e.g. instrument’s hardware state, preinvestigation data, experiment
description data etc. The collected data is stored together with the experiment data in the permanent storage of the user.
The stored data is then used for post processing and analysis of the experiment.
Paper Details
Date Published: 11 September 2014
PDF: 11 pages
Proc. SPIE 9212, Developments in X-Ray Tomography IX, 921217 (11 September 2014); doi: 10.1117/12.2060975
Published in SPIE Proceedings Vol. 9212:
Developments in X-Ray Tomography IX
Stuart R. Stock, Editor(s)
PDF: 11 pages
Proc. SPIE 9212, Developments in X-Ray Tomography IX, 921217 (11 September 2014); doi: 10.1117/12.2060975
Show Author Affiliations
Igor Khokhriakov, Helmholtz-Zentrum Geesthacht (Germany)
Lars Lottermoser, Helmholtz-Zentrum Geesthacht (Germany)
Rainer Gehrke, Deutsches Elektronen-Synchrotron (Germany)
Thorsten Kracht, Deutsches Elektronen-Synchrotron (Germany)
Lars Lottermoser, Helmholtz-Zentrum Geesthacht (Germany)
Rainer Gehrke, Deutsches Elektronen-Synchrotron (Germany)
Thorsten Kracht, Deutsches Elektronen-Synchrotron (Germany)
Eugen Wintersberger, Deutsches Elektronen-Synchrotron (Germany)
Andreas Kopmann, Karlsruhe Institute of Technology (Germany)
Matthias Vogelgesang, Karlsruhe Institute of Technology (Germany)
Felix Beckmann, Helmholtz-Zentrum Geesthacht (Germany)
Andreas Kopmann, Karlsruhe Institute of Technology (Germany)
Matthias Vogelgesang, Karlsruhe Institute of Technology (Germany)
Felix Beckmann, Helmholtz-Zentrum Geesthacht (Germany)
Published in SPIE Proceedings Vol. 9212:
Developments in X-Ray Tomography IX
Stuart R. Stock, Editor(s)
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