
Proceedings Paper
Intermediate field measurement to characterize the wavefront of high power laser large opticsFormat | Member Price | Non-Member Price |
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Paper Abstract
The French Laser MégaJoule (LMJ) is a high power laser project, dedicated to fusion and plasma experiments. It will
include 176 square beams involving thousands of large optical components. The wavefront performances of all those
optics are critical to achieve the desired focal spot shape and limit the hot spots that could damage the components. The
CEA has developed experimental methods to qualify precisely the quality of the large optical components manufactured
for the project and measure the effect of various defects. For specific components (coated or parabola mirrors, lenses or
gratings), classical techniques like interferometric setups may fail to measure the wavefront highest spatial frequencies
(> 1 mm-1). In order to improve the measurements, we have proposed characterization methods based upon a laser beam
diffraction interpretation. They present limits and we need to improve the wavefront measurement for high spatial
frequencies (> 1 mm-1). We present in this paper the intermediate field measurement based upon the Talbot effect theory
and the Fourier analysis of acquired intensity images. The technique consists in a double pass setup: a plane wave is
transmitted through the component twice, to simplify the setup and improve the measurement. Then, intensity images are
acquired at different distances with a CCD camera and lead to the wavefront power spectral density. We describe the
experimental setup to measure the wavefront of large specific components. We show experimental results. Finally, we
discuss about the advantages and the limits of such a method, and we compare it with our previous measurement
methods.
Paper Details
Date Published: 5 September 2014
PDF: 10 pages
Proc. SPIE 9205, Reflection, Scattering, and Diffraction from Surfaces IV, 92050S (5 September 2014); doi: 10.1117/12.2060526
Published in SPIE Proceedings Vol. 9205:
Reflection, Scattering, and Diffraction from Surfaces IV
Leonard M. Hanssen, Editor(s)
PDF: 10 pages
Proc. SPIE 9205, Reflection, Scattering, and Diffraction from Surfaces IV, 92050S (5 September 2014); doi: 10.1117/12.2060526
Show Author Affiliations
Frédéric Audo, Commissariat à l'Énergie Atomique (France)
Stéphane Bouillet, Commissariat à l'Énergie Atomique (France)
Stéphane Bouillet, Commissariat à l'Énergie Atomique (France)
Sandrine Chico, Commissariat à l'Énergie Atomique (France)
Jérôme Daurios, Commissariat à l'Énergie Atomique (France)
Jérôme Daurios, Commissariat à l'Énergie Atomique (France)
Published in SPIE Proceedings Vol. 9205:
Reflection, Scattering, and Diffraction from Surfaces IV
Leonard M. Hanssen, Editor(s)
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