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Proceedings Paper

Optical fiber refractometer based on silicon nitride nano-overlay deposited with PECVD method
Author(s): Bartosz Michalak; Mateusz Śmietana; Marcin Koba
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Paper Abstract

This work presents an application of polymer-clad silica (PCS) multimode optical fiber coated with high refractive index (nD>2.4) silicon nitride (SiNx) nano-overlay for refractive index (RI) sensing. The nano-overlay was deposited on 2.5 mm-long section of the fiber’s core using radio-frequency plasma-enhanced chemical vapor deposition (RF PECVD) method. We show that spectral response of the sensor to external RI strongly depends on the overlay deposition time. For just 6 min-long process the sensitivity calculated as a shift of the resonance observed in the transmission spectrum at about λ=600 nm with RI reaches 690 nm/RIU. The experimental results have been compared to numerical simulations.

Paper Details

Date Published: 2 June 2014
PDF: 4 pages
Proc. SPIE 9157, 23rd International Conference on Optical Fibre Sensors, 91575A (2 June 2014); doi: 10.1117/12.2059681
Show Author Affiliations
Bartosz Michalak, Warsaw Univ. of Technology (Poland)
Mateusz Śmietana, Warsaw Univ. of Technology (Poland)
Marcin Koba, Warsaw Univ. of Technology (Poland)
National Institute of Telecommunications (Poland)

Published in SPIE Proceedings Vol. 9157:
23rd International Conference on Optical Fibre Sensors
José M. López-Higuera; Julian D. C. Jones; Manuel López-Amo; José Luis Santos, Editor(s)

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