Proceedings Paper
Highly sensitive refractive index sensor based on two cascaded microfiber knots with Vernier effect| Format | Member Price | Non-Member Price |
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Paper Abstract
A highly sensitive refractive index (RI) sensor based on two cascaded microfiber knots with vernier effect is proposed
and demonstrated by theoretical arithmetic. Deriving from high proportional evanescent field of microfiber and sharp
spectrum fringes induced by vernier effect, a slight change of ambient RI will cause large variation of effective RI and
significant wavelength shift of resonant peaks, indicating high sensitivity and resolution of the proposed compound
resonator. Numerical analysis demonstrates a high sensitivity of 10000nm/RIU and a resolution of 5.57×10−5 RIU at the ambient RI around 1.33 for the fiber diameter of 1μm and cavity radii of R1 = 500μm, R2 = 547.62μm
Paper Details
Date Published: 2 June 2014
PDF: 4 pages
Proc. SPIE 9157, 23rd International Conference on Optical Fibre Sensors, 915786 (2 June 2014); doi: 10.1117/12.2059467
Published in SPIE Proceedings Vol. 9157:
23rd International Conference on Optical Fibre Sensors
José M. López-Higuera; Julian D. C. Jones; Manuel López-Amo; José Luis Santos, Editor(s)
PDF: 4 pages
Proc. SPIE 9157, 23rd International Conference on Optical Fibre Sensors, 915786 (2 June 2014); doi: 10.1117/12.2059467
Show Author Affiliations
Zhilin Xu, Huazhong Univ. of Science and Technology (China)
Qizhen Sun, Huazhong Univ. of Science and Technology (China)
Weihua Jia, Huazhong Univ. of Science and Technology (China)
Qizhen Sun, Huazhong Univ. of Science and Technology (China)
Weihua Jia, Huazhong Univ. of Science and Technology (China)
Perry Ping Shum, Huazhong Univ. of Science and Technology (China)
Nanyang Technological Univ. (Singapore)
Deming Liu, Huazhong Univ. of Science and Technology (China)
Nanyang Technological Univ. (Singapore)
Deming Liu, Huazhong Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 9157:
23rd International Conference on Optical Fibre Sensors
José M. López-Higuera; Julian D. C. Jones; Manuel López-Amo; José Luis Santos, Editor(s)
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