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Proceedings Paper

Application of scanning force microscopy and near-field optical microscopy to liquid crystalline systems: observing free surfaces, smectic structural forces, and molecular orientation
Author(s): Ricky L. Williamson; M. Rivera; Mervyn J. Miles; K. D. Jandt
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Paper Abstract

A combined scanning shear-force and near-field optical microscope was used to detect the liquid-vapor interface and the smectic layer structure through the thickness of a film of the alkyl cyranobiphenyl liquid crystal 8CB on a HOPG substrate. With noncontact imaging of a thin precursor layer, it was possible to follow the movement of a monolayer of the 8CB. Noncontact imaging combined with polarization SNOM was used to study the birefringent nature of a thin film of a liquid crystal polymer.

Paper Details

Date Published: 30 March 1995
PDF: 11 pages
Proc. SPIE 2384, Scanning Probe Microscopies III, (30 March 1995); doi: 10.1117/12.205933
Show Author Affiliations
Ricky L. Williamson, Univ. of Bristol (United Kingdom)
M. Rivera, Univ. of Bristol (United Kingdom)
Mervyn J. Miles, Univ. of Bristol (United Kingdom)
K. D. Jandt, Cornell Univ. (United States)

Published in SPIE Proceedings Vol. 2384:
Scanning Probe Microscopies III
Mehdi Vaez-Iravani, Editor(s)

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