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Proceedings Paper

Near-field microscopy of thin films: application to polymeric structures
Author(s): Mehdi Vaez-Iravani; Ricardo Toledo-Crow; Harald Ade; R. Spontak
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Paper Abstract

Near field scanning optical microscopy of thin birefringent samples is described. The system utilized is the linear polarizing near field microscope, resulting in a pure birefringence image of the sample. The sign of the birefringence is also preserved. Two specific classes of sample are studied. These include thin sections of Kevlar fibers, and polymer dispersed liquid crystals. Results are correlated with simultaneously obtained topographic images. Based on experimental observations, the relative strength of the optical indices of the structures is determined

Paper Details

Date Published: 30 March 1995
PDF: 7 pages
Proc. SPIE 2384, Scanning Probe Microscopies III, (30 March 1995); doi: 10.1117/12.205926
Show Author Affiliations
Mehdi Vaez-Iravani, Rochester Institute of Technology (United States)
Ricardo Toledo-Crow, Rochester Institute of Technology (United States)
Harald Ade, North Carolina State Univ. (United States)
R. Spontak, North Carolina State Univ. (United States)

Published in SPIE Proceedings Vol. 2384:
Scanning Probe Microscopies III
Mehdi Vaez-Iravani, Editor(s)

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