Future large X-ray observatories like ATHENA will be equipped with very large optics, obtained by assembling modular optical elements, named X-ray Optical Units (XOU) based on the technology of either Silicon Pore Optics or Slumped Glass Optics. In both cases, the final quality of the modular optic (a 5 arcsec HEW requirement for ATHENA) is determined by the accuracy alignment of the XOUs within the assembly, but also by the angular resolution of the individual XOU. This is affected by the mirror shape accuracy, its surface roughness, and the mutual alignment of the mirrors within the XOU itself. Because of the large number of XOUs to be produced, quality tests need to be routinely done to select the most performing stacked blocks, to be integrated into the final optic. In addition to the usual metrology based on profile and roughness measurements, a direct measurement with a broad, parallel, collimated and uniform Xray beam would be the most reliable test, without the need of a focal spot reconstruction as usually done in synchrotron light. To this end, we designed the BEaTriX (Beam Expander Testing X-ray facility) to be realized at INAF-OAB, devoted to the functional tests of the XOUs. A grazing incidence parabolic mirror and an asymmetrically cut crystal will produce a parallel X-ray beam broad enough to illuminate the entire aperture of the focusing elements. An X-ray camera at the focal distance from the mirrors will directly record the image. The selection of different crystals will enable to test the XOUs in the 1 - 5 keV range, included in the X-ray energy band of ATHENA (0.2-12 keV). In this paper we discuss a possible BEaTriX facility implementation. We also show a preliminary performance simulation of the optical system.

Date Published: 25 July 2014
PDF: 8 pages
Proc. SPIE 9144, Space Telescopes and Instrumentation 2014: Ultraviolet to Gamma Ray, 91445I (25 July 2014); doi: 10.1117/12.2057358

Published in SPIE Proceedings Vol. 9144:
Space Telescopes and Instrumentation 2014: Ultraviolet to Gamma Ray
Tadayuki Takahashi; Jan-Willem A. den Herder; Mark Bautz, Editor(s)