
Proceedings Paper
ACTPol: on-sky performance and characterizationFormat | Member Price | Non-Member Price |
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Paper Abstract
ACTPol is the polarization-sensitive receiver on the Atacama Cosmology Telescope. ACTPol enables sensitive millimeter wavelength measurements of the temperature and polarization anisotropies of the Cosmic Microwave Background (CMB) at arcminute angular scales. These measurements are designed to explore the process of cosmic structure formation, constrain or determine the sum of the neutrino masses, probe dark energy, and provide a foundation for a host of other cosmological tests. We present an overview of the first season of ACTPol observations focusing on the optimization and calibration of the first detector array as well as detailing the on-sky performance.
Paper Details
Date Published: 19 August 2014
PDF: 13 pages
Proc. SPIE 9153, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII, 915310 (19 August 2014); doi: 10.1117/12.2057243
Published in SPIE Proceedings Vol. 9153:
Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII
Wayne S. Holland; Jonas Zmuidzinas, Editor(s)
PDF: 13 pages
Proc. SPIE 9153, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII, 915310 (19 August 2014); doi: 10.1117/12.2057243
Show Author Affiliations
E. Grace, Princeton Univ. (United States)
J. Beall, National Institute of Standards and Technology (United States)
J. R. Bond, Canadian Institute for Theoretical Astrophysics, Univ. of Toronto (Canada)
H. M. Cho, National Institute of Standards and Technology (United States)
R. Datta, Univ. of Michigan (United States)
M. J. Devlin, Univ. of Pennsylvania (United States)
R. Dünner , Pontificia Univ. Católica de Chile (Chile)
A. E. Fox, National Institute of Standards and Technology (United States)
P. Gallardo, Cornell Univ. (United States)
Pontificia Univ. Católica de Chile (Chile)
M. Hasselfield, Princeton Univ. (United States)
The Univ. of British Columbia (Canada)
S. Henderson, Cornell Univ. (United States)
G. C. Hilton, National Institute of Standards and Technology (United States)
A. D. Hincks, The Univ. of British Columbia (Canada)
R. Hlozek, Princeton Univ. (United States)
J. Hubmayr, National Institute of Standards and Technology (United States)
K. Irwin, Stanford Univ. (United States)
J. Klein, Univ. of Pennsylvania (United States)
J. Beall, National Institute of Standards and Technology (United States)
J. R. Bond, Canadian Institute for Theoretical Astrophysics, Univ. of Toronto (Canada)
H. M. Cho, National Institute of Standards and Technology (United States)
R. Datta, Univ. of Michigan (United States)
M. J. Devlin, Univ. of Pennsylvania (United States)
R. Dünner , Pontificia Univ. Católica de Chile (Chile)
A. E. Fox, National Institute of Standards and Technology (United States)
P. Gallardo, Cornell Univ. (United States)
Pontificia Univ. Católica de Chile (Chile)
M. Hasselfield, Princeton Univ. (United States)
The Univ. of British Columbia (Canada)
S. Henderson, Cornell Univ. (United States)
G. C. Hilton, National Institute of Standards and Technology (United States)
A. D. Hincks, The Univ. of British Columbia (Canada)
R. Hlozek, Princeton Univ. (United States)
J. Hubmayr, National Institute of Standards and Technology (United States)
K. Irwin, Stanford Univ. (United States)
J. Klein, Univ. of Pennsylvania (United States)
B. Koopman, Cornell Univ. (United States)
D. Li, National Institute of Standards and Technology (United States)
M. Lungu, Univ. of Pennsylvania (United States)
L. Newburgh, Joseph Henry Labs. of Physics, Princeton Univ. (United States)
Jo. P. Nibarger, National Institute of Standards and Technology (United States)
M. D. Niemack, Cornell Univ. (United States)
L. Maurin, Pontificia Univ. Católica de Chile (Chile)
J. McMahon, Univ. of Michigan (United States)
S. Naess, Univ. of Oxford (United Kingdom)
L. A. Page, Princeton Univ. (United States)
C. Pappas, Princeton Univ. (United States)
B. L. Schmitt, Univ. of Pennsylvania (United States)
J. Sievers, Univ. of KwaZulu-Natal (South Africa)
Canadian Institute for Theoretical Astrophysics, Univ. of Toronto (Canada)
S. T. Staggs, Princeton Univ. (United States)
R. Thornton, West Chester Univ. of Pennsylvania (United States)
Univ. of Pennsylvania (United States)
J. Van Lanen, National Institute of Standards and Technology (United States)
E. J. Wollack, West Chester Univ. of Pennsylvania (United States)
D. Li, National Institute of Standards and Technology (United States)
M. Lungu, Univ. of Pennsylvania (United States)
L. Newburgh, Joseph Henry Labs. of Physics, Princeton Univ. (United States)
Jo. P. Nibarger, National Institute of Standards and Technology (United States)
M. D. Niemack, Cornell Univ. (United States)
L. Maurin, Pontificia Univ. Católica de Chile (Chile)
J. McMahon, Univ. of Michigan (United States)
S. Naess, Univ. of Oxford (United Kingdom)
L. A. Page, Princeton Univ. (United States)
C. Pappas, Princeton Univ. (United States)
B. L. Schmitt, Univ. of Pennsylvania (United States)
J. Sievers, Univ. of KwaZulu-Natal (South Africa)
Canadian Institute for Theoretical Astrophysics, Univ. of Toronto (Canada)
S. T. Staggs, Princeton Univ. (United States)
R. Thornton, West Chester Univ. of Pennsylvania (United States)
Univ. of Pennsylvania (United States)
J. Van Lanen, National Institute of Standards and Technology (United States)
E. J. Wollack, West Chester Univ. of Pennsylvania (United States)
Published in SPIE Proceedings Vol. 9153:
Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII
Wayne S. Holland; Jonas Zmuidzinas, Editor(s)
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