In the development of thin active mirrors for future x-ray telescopes there is a need for full field, non-null methods of rapidly characterising highly distorted surfaces without contact. Phase measuring deflectometry, due to its high dynamic range and flexibility, is a promising solution to this problem. In this paper is described a system developed by the authors at University College London, as well as the results of surface measurements using this methodology on thin sheets of actuated glass.

Date Published: 18 July 2014
PDF: 6 pages
Proc. SPIE 9151, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation, 91510S (18 July 2014); doi: 10.1117/12.2056996

Published in SPIE Proceedings Vol. 9151:
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation
Ramón Navarro; Colin R. Cunningham; Allison A. Barto, Editor(s)