
Proceedings Paper
Phase measuring deflectometry for thin actuated mirrorsFormat | Member Price | Non-Member Price |
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Paper Abstract
In the development of thin active mirrors for future x-ray telescopes there is a need for full field, non-null methods
of rapidly characterising highly distorted surfaces without contact. Phase measuring deflectometry, due to its
high dynamic range and flexibility, is a promising solution to this problem. In this paper is described a system
developed by the authors at University College London, as well as the results of surface measurements using this
methodology on thin sheets of actuated glass.
Paper Details
Date Published: 18 July 2014
PDF: 6 pages
Proc. SPIE 9151, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation, 91510S (18 July 2014); doi: 10.1117/12.2056996
Published in SPIE Proceedings Vol. 9151:
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation
Ramón Navarro; Colin R. Cunningham; Allison A. Barto, Editor(s)
PDF: 6 pages
Proc. SPIE 9151, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation, 91510S (18 July 2014); doi: 10.1117/12.2056996
Show Author Affiliations
Tom Catling, Univ. College London (United Kingdom)
David Brooks, Univ. College London (United Kingdom)
David Brooks, Univ. College London (United Kingdom)
Peter Doel, Univ. College London (United Kingdom)
Published in SPIE Proceedings Vol. 9151:
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation
Ramón Navarro; Colin R. Cunningham; Allison A. Barto, Editor(s)
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