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Proceedings Paper

EChO fine guidance sensor design and architecture
Author(s): Roland Ottensamer; Miroslaw Rataj; Jan-Rutger Schrader; Roman Ferstl; Manuel Güdel; Franz Kerschbaum; Armin Luntzer
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Paper Abstract

EChO, the Exoplanet Characterization Observatory, is an M-class candidate in the ESA Comic Vision programme. It will provide high resolution, multi-wavelength spectroscopic observations of exoplanets, measure their atmospheric composition, temperature and albedo. The scientific payload is a spectrometer covering the 0.4-11 micron waveband. High photometric stability over a time scale of about 10 hours is one of the most stringent requirements of the EChO mission. As a result, fine pointing stability relative to the host star is mandatory. This will be achieved through a Fine Guidance Sensor (FGS), a separate photometric channel that uses a fraction of the target star signal from the optical channel. The main task of the FGS is to ensure the centering, focusing and guiding of the satellite, but it will also provide supplemental high-precision astrometry and photometry of the target to ground for de-trending the spectra and complementary science. In this paper we give an overview of the current architectural design of the FGS subsystem and discuss related requirements as well as the expected performance.

Paper Details

Date Published: 2 August 2014
PDF: 10 pages
Proc. SPIE 9143, Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave, 91434O (2 August 2014); doi: 10.1117/12.2056475
Show Author Affiliations
Roland Ottensamer, Univ. Wien (Austria)
Miroslaw Rataj, Space Research Ctr. (Poland)
Jan-Rutger Schrader, SRON Netherlands Institute for Space Research (Netherlands)
Roman Ferstl, Univ. Wien (Austria)
Manuel Güdel, Univ. Wien (Austria)
Franz Kerschbaum, Univ. Wien (Austria)
Armin Luntzer, Univ. Wien (Austria)

Published in SPIE Proceedings Vol. 9143:
Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave
Jacobus M. Oschmann Jr.; Mark Clampin; Giovanni G. Fazio; Howard A. MacEwen, Editor(s)

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