
Proceedings Paper
Minimizing the bimetallic bending for cryogenic metal optics based on electroless nickelFormat | Member Price | Non-Member Price |
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Paper Abstract
Ultra-precise metal optics are key components of sophisticated scientific instruments in astronomy and space
applications. Especially for cryogenic applications, a detailed knowledge and the control of the coefficient of thermal
expansion (CTE) of the used materials are essential. Reflective optical components in IR- and NIR-instruments primarily
consist of the aluminum alloy Al6061. The achievable micro-roughness of diamond machined and directly polished
Al6061 does not fulfill the requirements for applications in the visible spectral range. Electroless nickel enables the
reduction of the mirror surface roughness to the sub-nm range by polishing. To minimize the associated disadvantageous
bimetallic effect, a novel material combination for cryogenic mirrors based on electroless nickel and hypereutectic
aluminum-silicon is investigated. An increasing silicon content of the aluminum material decreases the CTE in the
temperature range to be considered. This paper shows the CTE for aluminum materials containing about 42 wt% silicon
(AlSi42) and for electroless nickel with a phosphorous content ranging from 10.5 to 13 %. The CTE differ to about
0.5 × 10-6 K-1 in a temperature range from -185 °C (LN2) to 100 °C. Besides, the correlations between the chemical
compositions of aluminum-silicon materials and electroless nickel are shown. A metrology setup for cryo-interferometry
was developed to analyze the remaining and reversible shape deviation at cryogenic temperatures. Changes could be
caused by different CTE, mounting forces and residual stress conditions. In the electroless nickel layer, the resulting
shape deviation can be preshaped by deterministic correction processes such as magnetorheological finishing (MRF) at
room temperature.
Paper Details
Date Published: 18 July 2014
PDF: 9 pages
Proc. SPIE 9151, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation, 915136 (18 July 2014); doi: 10.1117/12.2056271
Published in SPIE Proceedings Vol. 9151:
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation
Ramón Navarro; Colin R. Cunningham; Allison A. Barto, Editor(s)
PDF: 9 pages
Proc. SPIE 9151, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation, 915136 (18 July 2014); doi: 10.1117/12.2056271
Show Author Affiliations
Jan Kinast, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Friedrich-Schiller-Univ. Jena (Germany)
Enrico Hilpert, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Friedrich-Schiller-Univ. Jena (Germany)
Nicolas Lange, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Friedrich-Schiller-Univ. Jena (Germany)
Andreas Gebhardt, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Friedrich-Schiller-Univ. Jena (Germany)
Enrico Hilpert, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Friedrich-Schiller-Univ. Jena (Germany)
Nicolas Lange, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Friedrich-Schiller-Univ. Jena (Germany)
Andreas Gebhardt, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Ralf-Rainer Rohloff, Max-Planck-Institut für Astronomie (Germany)
Stefan Risse, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Ramona Eberhardt, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Andreas Tünnermann, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Friedrich-Schiller-Univ. Jena (Germany)
Stefan Risse, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Ramona Eberhardt, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Andreas Tünnermann, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Friedrich-Schiller-Univ. Jena (Germany)
Published in SPIE Proceedings Vol. 9151:
Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation
Ramón Navarro; Colin R. Cunningham; Allison A. Barto, Editor(s)
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