
Proceedings Paper
Determination of ammonia in flue gases: a comparison between continuous-monitoring systemsFormat | Member Price | Non-Member Price |
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Paper Abstract
This paper presents a performance investigation of a number of available gas analyzers for ammonia monitoring in flue gases. The measurement systems included in the study were: MCS 100 (Perkin-Elmer), GASMET (Temet Instruments), OPSIS (OPSIS AB), GM 30 (Sick Opto-Electronic) and DOAS (Vattenfall Utveckling AB). The investigation focused on parameters such as the effects of interfering gases, comparisons between measured absolute concentrations of ammonia and obtained response times. The test program followed two stages: (1) measurements at a pilot scale oil burner for which the gas composition could be varied by injecting test gases, and (2) a comparison between the systems at a waste incinerator plant during various operating conditions. Results and experiences from the field testing and the measurements at the oil burner are presented.
Paper Details
Date Published: 10 February 1995
PDF: 10 pages
Proc. SPIE 2366, Optical Instrumentation for Gas Emissions Monitoring and Atmospheric Measurements, (10 February 1995); doi: 10.1117/12.205561
Published in SPIE Proceedings Vol. 2366:
Optical Instrumentation for Gas Emissions Monitoring and Atmospheric Measurements
Michael G. Yost; Dennis K. Killinger; Joseph Leonelli; William Vaughan; Dennis K. Killinger; William Vaughan; Michael G. Yost, Editor(s)
PDF: 10 pages
Proc. SPIE 2366, Optical Instrumentation for Gas Emissions Monitoring and Atmospheric Measurements, (10 February 1995); doi: 10.1117/12.205561
Show Author Affiliations
Annika Johansson, Vattenfall Utveckling AB (Sweden)
Henrik Harnevie, Vattenfall Utveckling AB (Sweden)
Henrik Harnevie, Vattenfall Utveckling AB (Sweden)
Hakan Axelsson, Vattenfall Utveckling AB (Sweden)
Published in SPIE Proceedings Vol. 2366:
Optical Instrumentation for Gas Emissions Monitoring and Atmospheric Measurements
Michael G. Yost; Dennis K. Killinger; Joseph Leonelli; William Vaughan; Dennis K. Killinger; William Vaughan; Michael G. Yost, Editor(s)
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