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Proceedings Paper

Isoplanatic patch considerations for solar telescope multi-conjugate adaptive optics
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Paper Abstract

I compare recent site surveys for the future large 4-meter solar and 30-meter nighttime telescopes at the nearby Haleakala and Mauna Kea sites respectively. They show that the outstanding early morning image quality at the solar site corresponds indeed to that observed at the late night one at the nighttime site. That confirms the notion that daytime solar site heating only shows itself later in the morning. The nighttime survey includes observations of the refractive index structure function Cn 2(h) to high altitudes from which the radius of the isoplanatic patch (Ɵ0) can be determined. At zenith (ζ = 00) it equals 2.5 arcsec at 500 nm wavelength. For the early morning (best) seeing at the solar site, which occurs at ζsun = 750 and the cos1.6(ζ) dependence of Θ0,that means an extremely small Ɵ0 (0.26 arcsec). Such small values compromise Adaptive Optics (AO) solar correlation wavefront sensing for which areas are needed equal to about 8”× 8” I suggest options for measuring Cn2(h), and therefore Ɵ0, during the day. These make use of the solar image as well as of daytime images of bright stars and planets. Some use the MASS technique on stars; some use the SHABAR technique using very large detector baselines on the Sun and shorter baselines on planets. It is suggested that these Cn2(h) measurements are made also during regular solar observations. In that way optimal solar observations can be planned using real-time Ɵ0 observations by image selection and optimization of the MCAO configuration.

Paper Details

Date Published: 13 August 2014
PDF: 10 pages
Proc. SPIE 9148, Adaptive Optics Systems IV, 914860 (13 August 2014); doi: 10.1117/12.2055348
Show Author Affiliations
Jacques Maurice Beckers, College of Optical Sciences, The Univ. of Arizona (United States)
Kiepenheuer-Institute für Sonnenphysik (Germany)

Published in SPIE Proceedings Vol. 9148:
Adaptive Optics Systems IV
Enrico Marchetti; Laird M. Close; Jean-Pierre Véran, Editor(s)

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