
Proceedings Paper
Fiber optic probe enabled by surface-enhanced Raman scattering for early diagnosis of potential acute rejection of kidney transplantFormat | Member Price | Non-Member Price |
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Paper Abstract
We have explored the use of a fiber-optic probe with surface-enhanced Raman scattering (SERS) sensing modality for
early, noninvasive and, rapid diagnosis of potential renal acute rejection (AR) and other renal graft dysfunction of kidney
transplant patients. Multimode silica optical fiber immobilized with colloidal Ag nanoparticles at the distal end was used
for SERS measurements of as-collected urine samples at 632.8 nm excitation wavelength. All patients with abnormal
renal graft function (3 AR episodes and 2 graft failure episodes) who were clinically diagnosed independently show
common unique SERS spectral features in the urines collected just one day after transplant. SERS-based fiber-optic
probe has excellent potential to be a bedside tool for early diagnosis of kidney transplant patients for timely medical
intervention of patients at high risk of transplant dysfunction.
Paper Details
Date Published: 18 June 2014
PDF: 7 pages
Proc. SPIE 9098, Fiber Optic Sensors and Applications XI, 90980P (18 June 2014); doi: 10.1117/12.2054976
Published in SPIE Proceedings Vol. 9098:
Fiber Optic Sensors and Applications XI
Henry H. Du; Gary Pickrell; Eric Udd; Christopher S. Baldwin; Jerry J. Benterou; Anbo Wang, Editor(s)
PDF: 7 pages
Proc. SPIE 9098, Fiber Optic Sensors and Applications XI, 90980P (18 June 2014); doi: 10.1117/12.2054976
Show Author Affiliations
Jingmao Chi, Stevens Institute of Technology (United States)
Hui Chen, Stevens Institute of Technology (United States)
Hui Chen, Stevens Institute of Technology (United States)
Peter Tolias, Stevens Institute of Technology (United States)
Henry Du, Stevens Institute of Technology (United States)
Henry Du, Stevens Institute of Technology (United States)
Published in SPIE Proceedings Vol. 9098:
Fiber Optic Sensors and Applications XI
Henry H. Du; Gary Pickrell; Eric Udd; Christopher S. Baldwin; Jerry J. Benterou; Anbo Wang, Editor(s)
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