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Proceedings Paper

Methodology for lens transmission measurement in the 8-13 micron waveband: integrating sphere versus camera-based
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Paper Abstract

Transmission is a key parameter in describing an IR-lens, but is also often the subject of controversy. One reason is the misinterpretation of “transmission” in infrared camera practice. If the camera lens is replaced by an alternative one the signal will be affected by two parameters: proportional to the square of the effective aperture based F-number and linearly to the transmission. The measure to collect energy is defined as the Energy Throughput ETP, and the signal level of the IR-camera is proportional to ETP. Most published lens transmission values are based on spectrophotometric measurement of plane-parallel witness pieces obtained from coating processes. Published aperture based F-numbers derive very often from ray tracing values in the on-axis bundle. The following contribution is about transmission measurement. It highlights the bulk absorption and coating issues of infrared lenses. Two different setups are built and tested, an Integrating Sphere (IS)-based setup and a Camera-Based (CB) setup. The comparison of the two principles also clarifies the impact of the F-number. One difficulty in accurately estimating lens transmission lies in measuring the ratio between the signal of ray bundles deviated by the lens under test and the signal of non-deviated ray bundles without lens (100% transmission). There are many sources for errors and deviations in LWIR-region including: background radiation, reflection from “rough” surfaces, and unexpected transmission bands. Care is taken in the set up that measured signals with and without the lens are consistent and reproducible. Reference elements such as uncoated lenses are used for calibration of both setups. When solid angle-based radiometric relationships are included, both setups yield consistent transmission values. Setups and their calibration will be described and test results on commercially available lenses will be published.

Paper Details

Date Published: 29 May 2014
PDF: 9 pages
Proc. SPIE 9071, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV, 90710R (29 May 2014); doi: 10.1117/12.2049927
Show Author Affiliations
Norbert Schuster, Umicore Electro-Optic Materials (Belgium)
Jan Verplancke, Umicore Electro-Optic Materials (Belgium)
Bergeron Salethaiyan, Umicore Electro-Optic Materials (Belgium)
John Franks, Umicore Electro-Optic Materials (Belgium)

Published in SPIE Proceedings Vol. 9071:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV
Gerald C. Holst; Keith A. Krapels; Gary H. Ballard; James A. Buford Jr.; R. Lee Murrer Jr., Editor(s)

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