Proceedings Paper
Reconstruction-free wavefront measurements with enhanced sensitivity| Format | Member Price | Non-Member Price |
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Paper Abstract
We report the development of a new device able to record an optical wavefront with an improved sensitivity and without resorting to any reconstruction technique such as Zernike polynomial decomposition. A direct comparison with a standard Shack-Hartmann sensor is performed within the field of Z-scan-like experiments. It is also shown using computer-generated holograms that our device is suitable for characterizing phase discontinuities or sharp phase variations.
Paper Details
Date Published: 1 May 2014
PDF: 8 pages
Proc. SPIE 9132, Optical Micro- and Nanometrology V, 91320J (1 May 2014); doi: 10.1117/12.2049695
Published in SPIE Proceedings Vol. 9132:
Optical Micro- and Nanometrology V
Christophe Gorecki; Anand Krishna Asundi; Wolfgang Osten, Editor(s)
PDF: 8 pages
Proc. SPIE 9132, Optical Micro- and Nanometrology V, 91320J (1 May 2014); doi: 10.1117/12.2049695
Show Author Affiliations
Thomas Godin, Institut FEMTO-ST, CNRS, Univ. de Franche-Comté (France)
Michael Fromager, Ctr. de Recherche sur les Ions, les Matériaux et la Photonique, CEA-CNRS, Univ. de Caen-Ensicaen (France)
Emmanuel Cagniot, Ctr. de Recherche sur les Ions, les Matériaux et la Photonique, CEA-CNRS, Univ. de Caen-Ensicaen (France)
Michael Fromager, Ctr. de Recherche sur les Ions, les Matériaux et la Photonique, CEA-CNRS, Univ. de Caen-Ensicaen (France)
Emmanuel Cagniot, Ctr. de Recherche sur les Ions, les Matériaux et la Photonique, CEA-CNRS, Univ. de Caen-Ensicaen (France)
Marc Brunel, COIRA, CNRS, Univ. Saint Etienne du Rouvray (France)
Kamel Aït-Ameur, Ctr. de Recherche sur les Ions, les Matériaux et la Photonique, CEA-CNRS, Univ. de Caen-Ensicaen (France)
Kamel Aït-Ameur, Ctr. de Recherche sur les Ions, les Matériaux et la Photonique, CEA-CNRS, Univ. de Caen-Ensicaen (France)
Published in SPIE Proceedings Vol. 9132:
Optical Micro- and Nanometrology V
Christophe Gorecki; Anand Krishna Asundi; Wolfgang Osten, Editor(s)
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