
Proceedings Paper
Chromatic confocal microscope using hybrid aspheric diffractive lensesFormat | Member Price | Non-Member Price |
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Paper Abstract
A chromatic confocal microscope is a single point non-contact distance measurement sensor. For three decades
the vast majority of the chromatic confocal microscope use refractive-based lenses to code the measurement axis
chromatically. However, such an approach is limiting the range of applications. In this paper the performance of
refractive, diffractive and Hybrid aspheric diffractive are compared. Hybrid aspheric diffractive lenses combine
the low geometric aberration of a diffractive lens with the high optical power of an aspheric lens. Hybrid aspheric
diffractive lenses can reduce the number of elements in an imaging system significantly or create large hyper-
chromatic lenses for sensing applications. In addition, diffractive lenses can improve the resolution and the
dynamic range of a chromatic confocal microscope. However, to be suitable for commercial applications, the
diffractive optical power must be significant. Therefore, manufacturing such lenses is a challenge. We show in this
paper how a theoretical manufacturing model can demonstrate that the hybrid aspheric diffractive configuration
with the best performances is achieved by step diffractive surface. The high optical quality of step diffractive
surface is then demonstrated experimentally.
Publisher’s Note: This paper, originally published on 5/10/14, was replaced with a corrected/revised version on 5/19/14. If you downloaded the original PDF but are unable to access the revision, please contact SPIE Digital Library Customer Service for assistance.
Paper Details
Date Published: 10 May 2014
PDF: 7 pages
Proc. SPIE 9130, Micro-Optics 2014, 91300Z (10 May 2014); doi: 10.1117/12.2048691
Published in SPIE Proceedings Vol. 9130:
Micro-Optics 2014
Hugo Thienpont; Jürgen Mohr; Hans Zappe; Hirochika Nakajima, Editor(s)
PDF: 7 pages
Proc. SPIE 9130, Micro-Optics 2014, 91300Z (10 May 2014); doi: 10.1117/12.2048691
Show Author Affiliations
Mathieu Rayer, Heriot-Watt Univ. (United Kingdom)
AMETEK Taylor Hobson Ltd. (United Kingdom)
AMETEK Taylor Hobson Ltd. (United Kingdom)
Daniel Mansfield, AMETEK Taylor Hobson Ltd. (United Kingdom)
Published in SPIE Proceedings Vol. 9130:
Micro-Optics 2014
Hugo Thienpont; Jürgen Mohr; Hans Zappe; Hirochika Nakajima, Editor(s)
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