Share Email Print
cover

Proceedings Paper

Nonlinear control of charge-coupled device sensors
Author(s): Greg E. Johnston
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

MOS photodetector control technology that enables nonlinear charge collection at the photosite. This innovation permits breakthrough performance of CCD image sensors by overcoming previous limitations in the measurement of absorption characteristics of film and other nonlinear forms.

Paper Details

Date Published: 14 March 1995
PDF: 9 pages
Proc. SPIE 2416, Cameras and Systems for Electronic Photography and Scientific Imaging, (14 March 1995); doi: 10.1117/12.204828
Show Author Affiliations
Greg E. Johnston, X-Ray Scanner Corp. (United States)


Published in SPIE Proceedings Vol. 2416:
Cameras and Systems for Electronic Photography and Scientific Imaging
Constantine N. Anagnostopoulos; Michael P. Lesser, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray