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Proceedings Paper

A pattern-driven design regularization methodology
Author(s): Jason P. Cain; Norma P. Rodriguez; Jason Sweis; Frank E. Gennari; Ya-Chieh Lai
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Paper Abstract

Pattern matching tools have become increasingly common in physical design flows for verification and layout analysis. Recently developed topological-based pattern matching engines offer several advantages over conventional three-value logic implementations. In this paper the use of such topological engines is explored for measuring physical design regularity, driving improvements in overall regularity, and for implementing targeted enhancements for suboptimal layout configurations.

Paper Details

Date Published: 28 March 2014
PDF: 9 pages
Proc. SPIE 9053, Design-Process-Technology Co-optimization for Manufacturability VIII, 905303 (28 March 2014); doi: 10.1117/12.2047741
Show Author Affiliations
Jason P. Cain, Advanced Micro Devices, Inc. (United States)
Norma P. Rodriguez, Advanced Micro Devices, Inc. (United States)
Jason Sweis, Cadence Design Systems, Inc. (United States)
Frank E. Gennari, Cadence Design Systems, Inc. (United States)
Ya-Chieh Lai, Cadence Design Systems, Inc. (United States)

Published in SPIE Proceedings Vol. 9053:
Design-Process-Technology Co-optimization for Manufacturability VIII
John L. Sturtevant; Luigi Capodieci, Editor(s)

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