
Proceedings Paper
Investigation of an efficient short-scan C-arm reconstruction method with radon-based redundancy handlingFormat | Member Price | Non-Member Price |
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Paper Abstract
The short-scan Feldkamp David Kress (FDK) method for C-arm CT reconstruction involves a heuristic raybased
weighting scheme to handle data redundancies. This scheme is known to be approximate under general
circumstances and it often creates low frequency image artifacts in regions away from the central axial plane.
Alternative algorithms, such as the one proposed by Defrise and Clack (DC),1 can handle data redundancy in
a theoretically exact manner and thus notably improve image quality. The DC algorithm, however, is computationally
more complex than FDK, as it requires a shift-variant 2D filtering of the data instead of a efficient 1D
filtering. In this paper, a modification of the original DC algorithm is investigated, which applies the efficient
FDK filtering scheme whereever possible and the DC filtering scheme only where it is required. This modification
leads to a more efficient implementation of the DC algorithm, in which filtering effort can be reduced by up to
about 70%, dependent on the specific geometry set-up. This gain in computation speed makes the DC method
even more attractive for use in an interventional environment, where fast and interactive X-ray imaging is a
crucial requirement.
Paper Details
Date Published: 19 March 2014
PDF: 8 pages
Proc. SPIE 9033, Medical Imaging 2014: Physics of Medical Imaging, 90330T (19 March 2014); doi: 10.1117/12.2043432
Published in SPIE Proceedings Vol. 9033:
Medical Imaging 2014: Physics of Medical Imaging
Bruce R. Whiting; Christoph Hoeschen, Editor(s)
PDF: 8 pages
Proc. SPIE 9033, Medical Imaging 2014: Physics of Medical Imaging, 90330T (19 March 2014); doi: 10.1117/12.2043432
Show Author Affiliations
Frank Dennerlein, Siemens AG (Germany)
Holger Kunze, Siemens AG (Germany)
Published in SPIE Proceedings Vol. 9033:
Medical Imaging 2014: Physics of Medical Imaging
Bruce R. Whiting; Christoph Hoeschen, Editor(s)
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