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Proceedings Paper

A flat-field correction method for photon-counting-detector-based micro-CT
Author(s): So E. Park; Jae G. Kim; M. A. A. Hegazy; Min H. Cho; Soo Y. Lee
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Paper Abstract

As low-dose computed tomography becomes a hot issue in the field of clinical x-ray imaging, photon counting detectors have drawn great attention as alternative x-ray image sensors. Even though photon-counting image sensors have several advantages over the integration-type sensors, such as low noise and high DQE, they are known to be more sensitive to the various experimental conditions like temperature and electric drift. Particularly, time-varying detector response during the CT scan is troublesome in photon-counting-detector-based CTs. To overcome the time-varying behavior of the image sensor during the CT scan, we developed a flat-field correction method together with an automated scanning mechanism. We acquired the flat-field images and projection data every view alternatively. When we took the flat-field image, we moved down the imaging sample away from the field-of-view with aid of computer controlled linear positioning stage. Then, we corrected the flat-field effects view-by-view with the flat-field image taken at given view. With a CdTe photon-counting image sensor (XRI-UNO, IMATEK), we took CT images of small bugs. The CT images reconstructed with the proposed flat-field correction method were much superior to the ones reconstructed with the conventional flat-field correction method.

Paper Details

Date Published: 19 March 2014
PDF: 7 pages
Proc. SPIE 9033, Medical Imaging 2014: Physics of Medical Imaging, 90335N (19 March 2014); doi: 10.1117/12.2043317
Show Author Affiliations
So E. Park, Kyung Hee Univ. (Korea, Republic of)
Jae G. Kim, Kyung Hee Univ. (Korea, Republic of)
M. A. A. Hegazy, Kyung Hee Univ. (Korea, Republic of)
Min H. Cho, Kyung Hee Univ. (Korea, Republic of)
Soo Y. Lee, Kyung Hee Univ. (Korea, Republic of)

Published in SPIE Proceedings Vol. 9033:
Medical Imaging 2014: Physics of Medical Imaging
Bruce R. Whiting; Christoph Hoeschen, Editor(s)

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