
Proceedings Paper
A stimulated Raman scattering imager using high-speed lateral electric field modulator and lock-in pixels amplifiersFormat | Member Price | Non-Member Price |
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Paper Abstract
A high speed Lateral Electric Field Modulator (LEFM) and lock-in pixels amplifiers for stimulated Raman
scattering (SRS)imager is presented. Since the generated signal from the SRS process is very small compared to
the offset signal, a technique suitable for extracting and amplifying the SRS signal is needed. The offset can be
canceled by tuning the phase delay between the demodulated pixel output signal and the sampling clock. The
small SRS signal in large offset is amplified by the differential integration. The proposed technique has been
investigated with an implementation of 64x8 pixels array using a pinned photodiode LEFM an lock-in pixels
amplifiers. Very small signal can be extracted from large offset signal. A ratio of the detected small SRS to
offset signal of less 10-5 is achieved.
Paper Details
Date Published: 4 March 2014
PDF: 8 pages
Proc. SPIE 9022, Image Sensors and Imaging Systems 2014, 90220D (4 March 2014); doi: 10.1117/12.2042471
Published in SPIE Proceedings Vol. 9022:
Image Sensors and Imaging Systems 2014
Ralf Widenhorn; Antoine Dupret, Editor(s)
PDF: 8 pages
Proc. SPIE 9022, Image Sensors and Imaging Systems 2014, 90220D (4 March 2014); doi: 10.1117/12.2042471
Show Author Affiliations
Kamel Mars, Shizuoka Univ. (Japan)
Beak Guseul, Shizuoka Univ. (Japan)
Sang Man Han, Shizuoka Univ. (Japan)
Taishi Takasawa, Shizuoka Univ. (Japan)
Beak Guseul, Shizuoka Univ. (Japan)
Sang Man Han, Shizuoka Univ. (Japan)
Taishi Takasawa, Shizuoka Univ. (Japan)
Keita Yasutomi, Shizuoka Univ. (Japan)
Keiichiro Kagawa, Shizuoka Univ. (Japan)
Mamoru Hashimoto, Osaka Univ. (Japan)
Shoji Kawahito, Shizuoka Univ. (Japan)
Keiichiro Kagawa, Shizuoka Univ. (Japan)
Mamoru Hashimoto, Osaka Univ. (Japan)
Shoji Kawahito, Shizuoka Univ. (Japan)
Published in SPIE Proceedings Vol. 9022:
Image Sensors and Imaging Systems 2014
Ralf Widenhorn; Antoine Dupret, Editor(s)
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