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Proceedings Paper

Experimental validation of applied strain sensors: importance, methods and still unsolved challenges
Author(s): Wolfgang R. Habel; Vivien G. Schukar; Franziska Mewis; Harald Kohlhoff
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Paper Abstract

Fiber-optic strain sensors are increasingly used in very different technical fields. Sensors are provided with specifications defined by the manufacturer or ascertained by the interested user. If deformation sensors are to be used to evaluate the long-term behavior of safety-relevant structures or to monitor critical structure components, their performance and signal stability must be of high quality to enable reliable data recording. The measurement system must therefore be validated according to established technical rules and standards before its application and after. In some cases, not all details of the complex characteristic and performance of applied fiber-optic sensors are sufficiently understood, or can be validated because of a lack of knowledge and methods to check the sensors’ behavior. This contribution focusses therefore on the importance of serious validation in avoiding a decrease or even deterioration of the sensors’ function. Methods for validation of applied sensors are discussed and should reveal weaknesses in validation of embedded or integrated fiber-optic deformation and/or strain sensors. An outlook to some research work that has to be carried out to ensure a well-accepted practical use of fiber-optic sensors is given.

Paper Details

Date Published: 15 October 2013
PDF: 6 pages
Proc. SPIE 8924, Fourth Asia Pacific Optical Sensors Conference, 892410 (15 October 2013); doi: 10.1117/12.2036591
Show Author Affiliations
Wolfgang R. Habel, Bundesanstalt für Materialforschung und -prüfung (Germany)
Vivien G. Schukar, Bundesanstalt für Materialforschung und -prüfung (Germany)
Franziska Mewis, Bundesanstalt für Materialforschung und -prüfung (Germany)
Harald Kohlhoff, Bundesanstalt für Materialforschung und -prüfung (Germany)

Published in SPIE Proceedings Vol. 8924:
Fourth Asia Pacific Optical Sensors Conference
Minghong Yang; Dongning Wang; Yun-Jiang Rao, Editor(s)

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