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Proceedings Paper

Further studies on thermal aspects of inclusion-dominated processes in laser-induced thin film damage
Author(s): Arthur H. Guenther; John K. McIver
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Paper Abstract

The inclusion dominated model of laser-induced damage is reexamined in order to explore the consequences of recent measured low values of thin film thermal conductivities. In the model absorption of radiation is assumed to only occur in the inclusion via Mie scattering. From the analysis two different values of the imaginary part of the index of refraction are predicted for a given damage threshold. Physical mechanisms are proposed for each value. Interestingly, varying the thermal conductivity of the both the host and inclusion over several orders of magnitude seem to have a less than expected influence on the damage threshold. However there is also proposed an effect of the index of refraction associated with a given damage threshold which is based upon two distinct absorption mechanisms. The results of this modified model are then compared with experimental data for damage thresholds of different thickness films.

Paper Details

Date Published: 1 August 1990
PDF: 6 pages
Proc. SPIE 1270, Optical Thin Films and Applications, (1 August 1990); doi: 10.1117/12.20365
Show Author Affiliations
Arthur H. Guenther, Los Alamos National Lab. (United States)
John K. McIver, Univ. of New Mexico (United States)

Published in SPIE Proceedings Vol. 1270:
Optical Thin Films and Applications
Reinhard Herrmann, Editor(s)

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