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Proceedings Paper

Laser-dielectric interactions
Author(s): Stephane Guizard; Philippe Daguzan; Krassimir Krastev; Philippe Martin; Guillaume Petite
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Paper Abstract

We present the results of recent experiments concerning the interaction of high intensity-short laser pulses with dielectric materials. The laser pulse creates a high density of free carriers, and two complementary experiments have been carried out to investigate the relaxation mechanisms in the solid, during and just after the excitation pulse. The first is a photoemission experiment, in which we measure the kinetic energy distribution of photoelectrons emitted by the surface of quartz ((alpha) -SiO2) samples irradiated by femtosecond laser pulses. We observe a high energy tail in the photoelectron spectra, which extend far beyond the photon energy. This shows that electrons photoexcited in the conduction band can absorb multiple photon and that this laser heating process is efficient even with sub-picosecond pulses. In the second experiment, we observe interferences in the frequency domain between two probe pulses. This technique allows us to measure the density of electrons photoexcited by a high intensity pump pulse in the conduction band within the sample, with a temporal resolution of 120 fs. The lifetime of the carriers is found to be 50 ps in MgO, 100 ps in Al2O3, and 150 fs in SiO2. We explain such a contrasted behavior in different oxides by the ultrafast formation of intrinsic defects in SiO2.

Paper Details

Date Published: 8 March 1995
PDF: 8 pages
Proc. SPIE 2461, ROMOPTO '94: Fourth Conference in Optics, (8 March 1995); doi: 10.1117/12.203593
Show Author Affiliations
Stephane Guizard, Commissarit a l'Energie Atomique (France)
Philippe Daguzan, Commissarit a l'Energie Atomique (France)
Krassimir Krastev, Commissarit a l'Energie Atomique (France)
Philippe Martin, Commissarit a l'Energie Atomique (France)
Guillaume Petite, Commissarit a l'Energie Atomique (France)

Published in SPIE Proceedings Vol. 2461:
ROMOPTO '94: Fourth Conference in Optics
Valentin I. Vlad, Editor(s)

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