Proceedings Paper
Accurate identification of blur parameters on joint blurred image of remote sensing| Format | Member Price | Non-Member Price |
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Paper Abstract
Aerial images captured using time delay and integration (TDI) charge-coupled devices (CCDs) could be blurred by three types of motion: forward image motion, turbulence disturbance and high frequency vibration. This work proposes a method to separately construct the three deterministic models by discerning or calculating the parameters from a single image blurred by all the three ones. Based on these models, we catch and separate the features existing in the power spectrum diagram, and select the methods with the best identification accuracy to the parameters. The results show the approach we mention can promise the accuracy of the determined parameters, which is helpful to improve the result of blind restoration algorithm.
Paper Details
Date Published: 19 December 2013
PDF: 7 pages
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904516 (19 December 2013); doi: 10.1117/12.2035686
Published in SPIE Proceedings Vol. 9045:
2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology
Xinggang Lin; Jesse Zheng, Editor(s)
PDF: 7 pages
Proc. SPIE 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 904516 (19 December 2013); doi: 10.1117/12.2035686
Show Author Affiliations
Jiong Liang, Beijing Institute of Graphic Communication (China)
Beijing Institute of Technology (China)
Ting fa Xu, Beijing Institute of Technology (China)
Ming zhu Shi, Beijing Institute of Technology (China)
Beijing Institute of Technology (China)
Ting fa Xu, Beijing Institute of Technology (China)
Ming zhu Shi, Beijing Institute of Technology (China)
Liang Feng, Beijing Institute of Technology (China)
Guo qiang Ni, Beijing Institute of Technology (China)
Guo qiang Ni, Beijing Institute of Technology (China)
Published in SPIE Proceedings Vol. 9045:
2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology
Xinggang Lin; Jesse Zheng, Editor(s)
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