
Proceedings Paper
A device for examing the imaging plane’s illumination nonuniformity of Wide FOV and short-focus optical imaging systemFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
The imaging plane’s illumination nonuniformity is an important parameter for wide FOV and short-focus optical imaging
system.But now the imaging plane’s illumination nonuniformity measurement device can not meet the requirements of
wide FOV, high uniformity and wide dynamic range.A new device combined with assymmetric double-hemisphere
technology was set up. It was composed of the special integrating sphere, CCD camera, precision displacement
mechanism, image acquisition, and testing software.The CCD was pre-calibrated and the testing software realized a
auto-correction,image acquisition, display and the illumination nonuniformity calulation.The light source was calibrated
by the national standard color temperature lamp.The device can provide a Lambert object surface .The advantages of the
device were that the FOV was as largely as 100°,and a wide illumination range of (10-3~103)Lx was achieved. An
optimal simulation of assymmetric double-hemisphere was calculated by LightTools,it was proved that the illuminace
nonuniformity at the outlet was better than 1.7%.Finally, the illumination nonuniformity of the integrating sphere and a
wide FOV and short-focus lens were respectively measured.The results show that, the illumination uniformity of the
integrating sphere is less than or equal to 1.49%,and the imaging plane’s illumination nonuniformity of the lens is
10.24%.
Paper Details
Date Published: 21 August 2013
PDF: 10 pages
Proc. SPIE 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications, 89082Q (21 August 2013); doi: 10.1117/12.2035272
Published in SPIE Proceedings Vol. 8908:
International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications
Jun Ohta; Nanjian Wu; Binqiao Li, Editor(s)
PDF: 10 pages
Proc. SPIE 8908, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications, 89082Q (21 August 2013); doi: 10.1117/12.2035272
Show Author Affiliations
Deng-kui Kang, Xi’an Institute of Applied Optics (China)
Chang-lu Jiang, Xi'an Institute of Applied Optics (China)
Liang Yuan, Xi'an Institute of Applied Optics (China)
Jia-ming Lin, Beijing Institute of Technology (China)
Chang-lu Jiang, Xi'an Institute of Applied Optics (China)
Liang Yuan, Xi'an Institute of Applied Optics (China)
Jia-ming Lin, Beijing Institute of Technology (China)
Hong Yang, Xi'an Institute of Applied Optics (China)
Xue Zheng, Xi'an Institute of Applied Optics (China)
Yu Guo, Xi'an Institute of Applied Optics (China)
Shi-bang Ma, Xi'an Institute of Applied Optics (China)
Xue Zheng, Xi'an Institute of Applied Optics (China)
Yu Guo, Xi'an Institute of Applied Optics (China)
Shi-bang Ma, Xi'an Institute of Applied Optics (China)
Published in SPIE Proceedings Vol. 8908:
International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Sensors and Applications
Jun Ohta; Nanjian Wu; Binqiao Li, Editor(s)
© SPIE. Terms of Use
