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Proceedings Paper

The lifetime prediction model of stirling cryocooler for infrared detector assembly
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Paper Abstract

With the rapid development of infrared focal plane array detector, stirling cyrocooler as a cold source has played an important role in space application. However, it is difficult to qualify its reliability and life expectancy before space application. Existing experiment and research data show that the most critical factor to restrict stirling cryocooler’s service life is working gas contamination. Based on outgassing of stirling cryocooler internal material and its relationship with temperature, time and outgassing experimental data, the failure life model of contamination is proposed. By thousands of hours of accelerated life test, two types of prototype cryocooler have been verified for applicability of the proposed life model, and the working gas analysis of tested cryocoolers also proved the existence of contamination. Afterwards, through three group contaminations adding experiment of different level water vapor, the degradation characteristics of more than 1000 hour have proved complying with the life model above. Finally, the paper further verified the applicability of this model by the fitting of experimental data of long-term running in working condition. Consequently, the life model of stirling cryocooler caused contamination degradation is established, as well as an accelerated lifetime evaluation technique was proposed for stirling cryocooler.

Paper Details

Date Published: 11 September 2013
PDF: 8 pages
Proc. SPIE 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications, 89075L (11 September 2013); doi: 10.1117/12.2035196
Show Author Affiliations
Shao-hua Yang, China Electronic Product Reliability and Environmental Testing Research Institute (China)
Xin-guang Liu, Shanghai Institute of Technical Physics (China)
Yi-nong Wu, Shanghai Institute of Technical Physics (China)

Published in SPIE Proceedings Vol. 8907:
International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
Haimei Gong; Zelin Shi; Qian Chen; Jin Lu, Editor(s)

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