
Proceedings Paper
Evanescent field scanning optical microscopyFormat | Member Price | Non-Member Price |
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Paper Abstract
The authors propose an alternative method for high resolution optical microscopy - Evanescent Field Scanning Optical
Microscopy (EFSOM) which eliminates implementation of the scanning tip compare to classical NSOM technique. The
approach involves scanning a sample in the evanescent-field of a prism generated using total internal reflection (TIR)
and recording the reflected power as a function of position. The reflection pattern of the wave is collected and processed,
using comparative differentiation. The extracted information is processed further to eliminate any distortions. The
system is not limited by diffraction and resolution primarily depends on the characteristics of the photo-detector and
scanning velocity. Implementation of thin silver layer and coupling of incident radiation into Surface Plasmons
Polaritons (SPP) improves system sensitivity and reduces photo detector dynamic range requirements.
Paper Details
Date Published: 7 March 2014
PDF: 8 pages
Proc. SPIE 8982, Optical Components and Materials XI, 89821C (7 March 2014); doi: 10.1117/12.2035166
Published in SPIE Proceedings Vol. 8982:
Optical Components and Materials XI
Michel J. F. Digonnet; Shibin Jiang, Editor(s)
PDF: 8 pages
Proc. SPIE 8982, Optical Components and Materials XI, 89821C (7 March 2014); doi: 10.1117/12.2035166
Show Author Affiliations
Vitaly Sukharenko, The City College of New York (United States)
Roger Dorsinville, The City College of New York (United States)
Published in SPIE Proceedings Vol. 8982:
Optical Components and Materials XI
Michel J. F. Digonnet; Shibin Jiang, Editor(s)
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