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Proceedings Paper

Design and analysis of a novel self-deployable baffle
Author(s): Kai Du; Kewei Yin; Hua Li; Sheng Liao; Fengping Long
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Paper Abstract

As the improvement of Astronomy technology, the size of the space optical system is developing toward huge type. However, the capability of the carriers of the space optical systems, which has got rid in the way of the development of the space optical system, is limited. To solve this problem, a self-deployable baffle is discussed, a method of the deployment utilizing elastic strain energy is advanced, and a new deployable baffle is designed in this paper. The baffle here consists of three or more sleeves, and each diameter of the sleeve is different in order to make the whole structure contract easily. The baffle is staying in contraction state until it is in the state of working. It is able to deploy into working state as required in a very short time. Well moving stabilization and high precision of deployment are ensured in this new style of deployable baffle. In order to reduce the mass of the baffle, every sleeve in the system uses the structure of thin board. As a result of the use of sleeve structure, the inner faces of the baffle are varied in each sleeve. To prove it is still effective in the optical system, professional software of ASAP is used to test its behavior. All the analysis and emulation prove that the baffle in working state is able to resist the stray light from the outside of the Field of View (FOV), improve the quality of the imaging, and meet the requirements of the optical system.

Paper Details

Date Published: 11 September 2013
PDF: 9 pages
Proc. SPIE 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications, 890758 (11 September 2013); doi: 10.1117/12.2034946
Show Author Affiliations
Kai Du, Institute of Optics and Electronics (China)
Univ. of Chinese Academy of Sciences (China)
Kewei Yin, Institute of Optics and Electronics (China)
Univ. of Chinese Academy of Sciences (China)
Hua Li, Institute of Optics and Electronics (China)
Sheng Liao, Institute of Optics and Electronics (China)
Fengping Long, PanGang Group Research Institute Co., Ltd. (China)


Published in SPIE Proceedings Vol. 8907:
International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
Haimei Gong; Zelin Shi; Qian Chen; Jin Lu, Editor(s)

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