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Proceedings Paper

Design of the in-situ testing system for the accelerated life test of the space infrared device
Author(s): Xianliang Zhu; Haiyan Zhang; Yang Wang; Xiangrong He; Haimei Gong
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Paper Abstract

Space infrared detector is the core component of photoelectric conversion in the infrared system, the indicator of which, such as sensibility and reliability, limits the optimum performance of the detection system. In the reliability research of infrared detector, the operating life of the device is a very important index and also a significant subject in the engineering application. In the accelerated life test of space infrared detector, it was difficult to periodically measure blackbody response signal of infrared detector, due to equipment limitations for a long time. Accordingly, it was also hard to get abundant failure data of devices for statistical analysis. For this problem, we designed a novel multi-station testing system for accelerated life test of space infrared device, in which response signal as well as temperature can be measured in-situ and recorded for further analysis. Based on theoretical calculation and analysis of actual measured data, we studied and designed the mechanical structure of the equipment and the key component of the testing system, such as the displacement platform, illustrated the control algorithm and put up a system design proposal which meet the testing requirements well. This work technically supports the accelerated life test of space infrared device.

Paper Details

Date Published: 11 September 2013
PDF: 7 pages
Proc. SPIE 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications, 890750 (11 September 2013); doi: 10.1117/12.2034897
Show Author Affiliations
Xianliang Zhu, Shanghai Institute of Technical Physics (China)
Univ. of Chinese Academy of Sciences (China)
Haiyan Zhang, Shanghai Institute of Technical Physics (China)
Yang Wang, Shanghai Institute of Technical Physics (China)
Xiangrong He, Shanghai Institute of Technical Physics (China)
Haimei Gong, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 8907:
International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
Haimei Gong; Zelin Shi; Qian Chen; Jin Lu, Editor(s)

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